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IS61LV12816 Datasheet(PDF) 3 Page - Integrated Silicon Solution, Inc |
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IS61LV12816 Datasheet(HTML) 3 Page - Integrated Silicon Solution, Inc |
3 / 12 page IS61LV12816 Integrated Silicon Solution, Inc. — 1-800-379-4774 3 Rev. C 02/05/2003 ISSI® OPERATING RANGE Range Ambient Temperature VDD Commercial 0°C to + 70°C 3.3V ± 10% Industrial –40°C to + 85°C 3.3V ± 10% DC ELECTRICAL CHARACTERISTICS (Over Operating Range) Symbol Parameter Test Conditions Min. Max. Unit VOH Output HIGH Voltage VDD = Min., IOH = –4.0 mA 2.4 — V VOL Output LOW Voltage VDD = Min., IOL = 8.0 mA — 0.4 V VIH Input HIGH Voltage(1) 2VDD + 0.3 V VIL Input LOW Voltage(1) –0.3 0.8 V ILI Input Leakage GND ≤ VIN ≤ VDD –1 1 µA ILO Output Leakage GND ≤ VOUT ≤ VDD, Outputs Disabled –1 1 µA Note: 1. VIL (min.) = –0.3V DC; VIL (min.) = –2.0V AC (pulse width - 2.0 ns). VIH (max.) = VDD + 0.3V DC; VIH (max.) = VDD + 2.0V AC (pulse width - 2.0 ns). PIN DESCRIPTIONS A0-A16 Address Inputs I/O0-I/O15 Data Inputs/Outputs CE Chip Enable Input OE Output Enable Input WE Write Enable Input LB Lower-byte Control (I/O0-I/O7) UB Upper-byte Control (I/O8-I/O15) NC No Connection VDD Power GND Ground ABSOLUTE MAXIMUM RATINGS(1) Symbol Parameter Value Unit VDD Power Supply Voltage Relative to GND –0.3 to 4.0 V VTERM Terminal Voltage with Respect to GND –0.5 to VDD + 0.5 V TSTG Storage Temperature –65 to + 150 °C PT Power Dissipation 1.0 W IOUT DC Output Current ±20 mA Note: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliabil- ity. |
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