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MC100EPT23 Datasheet(PDF) 2 Page - ON Semiconductor

Part No. MC100EPT23
Description  3.3V Dual Differential LVPECL/LVDS/CML to LVTTL/LVCMOS Translator
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Maker  ONSEMI [ON Semiconductor]
Homepage  http://www.onsemi.com
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MC100EPT23
http://onsemi.com
2
1
2
3
45
6
7
8
Q0
GND
VCC
Figure 1. Logic Diagram and 8−Lead Pinout
D0
Q1
D1
D1
D0
LVPECL
LVTTL
(Top View)
Table 1. PIN DESCRIPTION
Pin
Function
Q0, Q1
LVTTL/LVCMOS Outputs
D0**, D1**
D0**, D1**
Differential LVPECL/LVDS/CML Inputs
VCC
Positive Supply
GND
Ground
EP
Exposed pad must be connected to a
sufficient thermal conduit. Electrically connect
to the most negative supply or leave floating
open.
** Pins will default to VCC/2 when left open.
Table 2. ATTRIBUTES
Characteristics
Value
Internal Input Pulldown Resistor
50 k
W
Internal Input Pullup Resistor
50 k
W
ESD Protection
Human Body Model
Machine Model
Charged Device Model
> 1500 V
> 100 V
> 2 kV
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)
Level 1
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
Transistor Count
91 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, see Application Note AND8003/D.
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
Power Supply
GND = 0 V
3.8
V
VI
Input Voltage
GND = 0 V
VI  VCC
3.8
V
Iout
Output Current
Continuous
Surge
50
100
mA
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
SOIC−8
SOIC−8
190
130
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
SOIC−8
41 to 44
°C/W
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
TSSOP−8
TSSOP−8
185
140
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
TSSOP−8
41 to 44
°C/W
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
DFN8
DFN8
129
84
°C/W
°C/W
Tsol
Wave Solder
Pb
Pb−Free
<2 to 3 sec @ 248
°C
<2 to 3 sec @ 260
°C
265
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.




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