MC10171

http://onsemi.com

3

TEST VOLTAGE VALUES (Volts)

@ Test Temperature

–30

°C

–0.890

–1.890

–1.205

–1.500

–5.2

+25

°C

–0.810

–1.850

–1.105

–1.475

–5.2

+85

°C

–0.700

–1.825

–1.035

–1.440

–5.2

Pin

Under

TEST VOLTAGE APPLIED TO PINS LISTED BELOW

(V

)

Characteristic

Symbol

Under

Test

Gnd

Power Supply Drain Current

8

2,7,9,14,15

8

1, 16

Input Current

14

14

8

1, 16

14

14

8

1, 16

Output Voltage

Logic 1

6

13

15

15

8

8

1, 16

1, 16

Output Voltage

Logic 0

13

2,7,9,14,15

8

1, 16

Threshold Voltage

Logic 1

6

13

15

15

8

8

1, 16

1, 16

Threshold Voltage

Logic 0

6

13

2,9,14,15

2,7,14,15

7

9

8

8

1, 16

1, 16

Switching Times

(50

Ω Load)

+0.31V

Pulse In

Pulse Out

–3.2 V

+2.0 V

Propagation Delay

6

6

13

13

2,9,14,15

2,9,14,15

2,9,14,15

2,9,14,15

7

7

7

7

6

6

13

13

8

8

8

8

1, 16

1, 16

1, 16

1, 16

Rise Time

(20 to 80%)

6

13

7

7

6

13

8

8

1, 16

1, 16

Fall Time

(20 to 80%)

6

13

7

7

6

13

8

8

1, 16

1, 16

Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been

established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.

Outputs are terminated through a 50-ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the

same manner.