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BQ27200DRKRG4 Datasheet(PDF) 4 Page - Texas Instruments |
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BQ27200DRKRG4 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 31 page www.ti.com bq27000, bq27200 SLUS556D – SEPTEMBER 2004 – REVISED MARCH 2006 ELECTRICAL CHARACTERISTICS (continued) over operating free-air temperature range and supply voltage range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT STANDARD HDQ SERIAL COMMUNICATION TIMING (bq27000 only) t(B) Break timing 190 t(BR) Break recovery 40 t(CYCH) Host bit window 190 t(HW1) Host sends 1 0.5 50 t(HW0) Host sends 0 86 145 µs t(RSPS) bqJUNIOR to host response 190 320 t(CYCD) bqJUNIOR bit window 190 250 t(DW1) bqJUNIOR sends 1 32 50 t(DW0) bqJUNIOR sends 0 80 145 STANDARD I2C SERIAL COMMUNICATION TIMING (bq27200 only) tr SCL/SDA rise time 1 µs tf SCL/SDA fall time 300 ns tw(H) SCL pulse width (high) 4 tw(L) SCL pulse width (low) 4.7 µs tsu(STA) Setup for repeated start 4.7 td(STA) Start to first falling edge of SCL 4 tsu(DAT) Data setup time 250 ns th(DAT) Data hold time 300 tsu(STOP) Setup time for stop 4 µs t(BUF) Bus free time between stop and start 4.7 f(SCL) Clock frequency 100 kHz t(BUSERR) Bus error timeout 17.3 21.2 s 4 Submit Documentation Feedback |
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