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TDA1545A Datasheet(PDF) 9 Page - NXP Semiconductors |
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TDA1545A Datasheet(HTML) 9 Page - NXP Semiconductors |
9 / 20 page 1997 Sep 04 9 Philips Semiconductors Preliminary specification Stereo continuous calibration DAC TDA1545A Notes 1. At code 0000H. 2. Vripple = 1% of supply voltage and fripple = 100 Hz. 3. Measured with 1 kHz sinewave generated at a sampling rate of 192 kHz. 4. Measured with 1 kHz sinewave over a 20 Hz to 20 kHz bandwidth generated at a sampling rate of 192 kHz. 5. R3 = R4 = 11 k Ω; see Fig.1; IFS = 2 mA. THD total harmonic distortion including noise at 0 dB; −−88 −78 dB note 3; see Fig.7 − 0.004 0.01 % including noise at −60 dB; −−33 −24 dB note 3; Fig.7 − 2.2 6 % including noise at −60 dB, −−35 − dB A-weighting − 1.8 − % R3 =R4=11k Ω see Fig.1; IFS =2mA − 1.4 − % including noise at 0 dB; note 4 −−84 −70 dB − 0.006 0.03 % tcs settling time ±1 LSB − 0.2 −µs α channel separation 86 95 − dB |dIO| unbalance between outputs note 3 − 0.2 0.3 dB |td| delay time between outputs −±0.2 −µs S/N signal-to-noise ratio (A-weighting) at bipolar zero note 1 86 98 − dB note 5 − 101 − dB SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT |
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