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PS12018-A Datasheet(PDF) 5 Page - Mitsubishi Electric Semiconductor |
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PS12018-A Datasheet(HTML) 5 Page - Mitsubishi Electric Semiconductor |
5 / 6 page MITSUBISHI SEMICONDUCTOR <Application Specific Intelligent Power Module> PS12018-A FLAT-BASE TYPE INSULATED TYPE Jan. 2000 PRELIMINARY Notice: This is not a final specification. Some parametric limits are subject to change. SC delay time Short circuit sensing signal VS Error output FO1 Gate signal Vo of each phase upper arm(ASIPM internal) Input signal VCIN of each phase upper arm 0V 0V 0V 0V 0V 0V 0V 0V 0V Input signal VCIN(p) of each phase upper arm Input signal VCIN(n) of each phase lower arm Gate signal Vo(p) of each phase upper arm (ASIPM internal) Gate signal Vo(n) of each phase upper arm (ASIPM internal) Error output FO1 200 –200 Analogue output signal data hold range 1 2 3 4 5 400 300 100 0 –100 –300 –400 0 VC+(200%) VC0 VC –(200%) VC+ VC– min max Real load current peak value.(%)(Ic=Io! 2) VDH=15V VDL=5V TC= –20~100˚C Note : Input interlock protection circuit ; It is operated when the input signals for any upper-arm / lower-arm pair of a phase are simulta- neously in “LOW” level. By this interlocking, both upper and lower IGBTs of this mal-triggered phase are cut off, and “FO” signal is outputted. After an “input interlock” operation the circuit is latched. The “FO” is reset by the high-to-low going edge of either an upper-leg, or a lower-leg input, whichever comes in later. Note : Shor t circuit protection operation. The protection operates with “FO” flag and reset on a pulse-by-pulse scheme. The protection by gate shutdown is given only to the IGBT that senses an overload (excluding the IGBT for the “Brake”). Fig. 4 OUTPUT CURRENT ANALOGUE SIGNALING LINEARITY Fig. 5 OUTPUT CURRENT ANALOGUE SIGNALING “DATA HOLD” DEFINITION Fig. 7 TIMING CHART AND SHORT CIRCUIT PROTECTION OPERATION Fig. 6 INPUT INTERLOCK OPERATION TIMING CHART VCH(5 µs) VCH(505 µs) 0V VC 500 µs rCH= VCH(505 µs)-VCH(5µs) VCH(5 µs) Note ; Ringing happens around the point where the signal output voltage changes state from “analogue” to “data hold” due to test circuit arrangement and instrumentational trouble. Therefore, the rate of change is measured at a 5 µs delayed point. |
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