CAT93C76 (Rev. A)

Doc. No. MD-1090 Rev. B

2

© Catalyst Semiconductor, Inc.

Characteristics subject to change without notice

ABSOLUTE MAXIMUM RATINGS

(1)

Parameters

Ratings

Units

Temperature Under Bias

–55 to +125

ºC

Storage Temperature

–65 to 150

ºC

Voltage on any Pin with Respect to Ground

(2)

V

-2.0 to +7.0

V

Lead Soldering Temperature (10 seconds)

300

ºC

Output Short Circuit Current

(3)

100

mA

RELIABILITY CHARACTERISTICS

(3)

Symbol

Parameter

Reference Test Method

Min

Units

(4)

Endurance

MIL-STD-883, Test Method 1033

1,000,000

Cycles/Byte

(4)

Data Retention

MIL-STD-883, Test Method 1008

100

Years

(4)

ESD Susceptibility

MIL-STD-883, Test Method 3015

2000

V

(4)(5)

Latch-Up

JEDEC Standard 17

100

mA

D.C. OPERATING CHARACTERISTICS

Symbol

Parameter

Test Conditions

Min

Typ

Max

Units

Power Supply Current (Write)

1

3

mA

Power Supply Current (Read)

300

500

µA

Power Supply Current

(Standby) (x8 Mode)

CS = 0V ORG = GND

2

10

µA

Power Supply Current

(Standby) (x16Mode)

0

(6)

10

µA

Input Leakage Current

0

(6)

10

µA

Output Leakage Current

0

(6)

10

µA

ORG Pin Leakage Current

1

10

µA

Input Low Voltage

-0.1

0.8

V

Input High Voltage

2

V

Input Low Voltage

0

V

Input High Voltage

V

Output Low Voltage

0.4

V

Output High Voltage

2.4

V

Output Low Voltage

0.1

V

Output High Voltage

V

Notes:

(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this

specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.

(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20ns. Maximum DC

(3) Output shorted for no more than one second.

(4) These parameters are tested initially and after a design or process change that affects the parameter.

(6) 0µA is defined as less than 900nA.