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SN75HVD08DG4 Datasheet(PDF) 2 Page - Texas Instruments |
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SN75HVD08DG4 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 19 page www.ti.com Host SN65HVD08 Power Bus and Return Resistance Isolation Barrier Remote (One of n Shown) 5 V Power Direct Connection to Host 5 V Return PACKAGE DISSIPATION RATINGS ABSOLUTE MAXIMUM RATINGS SN75HVD08, SN65HVD08 SLLS550C – NOVEMBER 2002 – REVISED JULY 2006 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. ORDERING INFORMATION SPECIFIED TEMPERATURE PART NUMBER PACKAGE PACKAGE MARKING RANGE SN65HVD08D –40°C to 85°C SOIC VP08 SN65HVD08P –40°C to 85°C PDIP 65HVD08 SN75HVD08D 0°C to 70°C SOIC VN08 SN75HVD08P 0°C to 70°C PDIP 75HVD08 PACKAGE TA≤ 25°C POWER RATING DERATING FACTOR ABOVE TA = 25°C TA = 85°C POWER RATING SOIC (D) 710 mW 5.7 mW/°C 369 mW PDIP (P) 1000 mW 8 mW/°C 520 mW over operating free-air temperature range unless otherwise noted(1)(2) UNIT Supply voltage, VCC -0.3 V to 6 V Voltage range at A or B -9 V to 14 V Input voltage range at D, DE, R or RE -0.5 V to VCC + 0.5 V Voltage input range, transient pulse, A and B, through 100 Ω -25 V to 25 V Receiver ouput current, IO –11 mA to 11 mA A, B, and GND 16 kV Human Body Model (3) Electrostatic discharge All pins 4 kV Charged-Device Model(4) All pins 1 kV Continuous total power dissipation See Dissipation Rating Table (1) Stresses beyond those listed under "absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal. (3) Tested in accordance with JEDEC Standard 22, Test Method A114-A. (4) Tested in accordance with JEDEC Standard 22, Test Method C101. 2 Submit Documentation Feedback |
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