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ISPLSI3448 Datasheet(PDF) 5 Page - Lattice Semiconductor

Part No. ISPLSI3448
Description  In-System Programmable High Density PLD
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Maker  LATTICE [Lattice Semiconductor]
Homepage  http://www.latticesemi.com
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 5 page
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Specifications ispLSI 3448
5
Switching Test Conditions
Input Pulse Levels
Table 2-0003/3448
Input Rise and Fall Time
Input Timing Reference Levels
Ouput Timing Reference Levels
Output Load
GND to 3.0V
1.5V
1.5V
See Figure 2
3-state levels are measured 0.5V from
steady-state active level.
≤ 3 ns 10% to 90%
Output Load conditions (See Figure 2)
TEST CONDITION
R1
R2
CL
A
470
390
35pF
B
390
35pF
470
390
35pF
Active High
Active Low
C
470
390
5pF
390
5pF
Active Low to Z
at V +0.5V
OL
Active High to Z
at V
-0.5V
OH
Table 2 - 0004A
+ 5V
R1
R2
CL*
Device
Output
Test
Point
*CL includes Test Fixture and Probe Capacitance.
0213A
Figure 2. Test Load
DC Electrical Characteristics
Over Recommended Operating Conditions
VOL
SYMBOL
1. One output at a time for a maximum duration of one second. V
= 0.5V was selected to avoid test problems
by tester ground degradation. Guaranteed but not 100% tested.
2. Measured using 28 16-bit counters.
3. Typical values are at V = 5V and T = 25
°C.
4. Maximum I
varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate
maximum I
.
Table 2-0007/3448
1
VOH
IIH
IIL
IIL-isp
PARAMETER
IIL-PU
IOS
2, 4
ICC
Output Low Voltage
Output High Voltage
Input or I/O High Leakage Current
Input or I/O Low Leakage Current
ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
I = 8 mA
I
= -4 mA
3.5V
≤ V ≤ V
0V
≤ V ≤ V (Max.)
0V
≤ V ≤ V
0V
≤ V ≤ V
V = 5V, V
= 0.5V
V = 0.0V, V = 3.0V, f
= 1 MHz
OL
OH
IN
IL
IN
CC
IN
IL
IN
IL
CC
OUT
CLOCK
IL
IH
CONDITION
MIN.
TYP.
MAX.
UNITS
3
2.4
470
0.4
10
-10
-150
-150
-200
V
V
µA
µA
µA
µA
mA
mA
CC
A
OUT
CC
CC




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