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EML10W5575CB-J59 Datasheet(PDF) 7 Page - Bookham, Inc. |
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EML10W5575CB-J59 Datasheet(HTML) 7 Page - Bookham, Inc. |
7 / 9 page Data Sheet 7 Reliability Bookham has a corporate policy for continuous improvement, to provide optical components with superior quality in terms of opto-electronic performance and operational life and reliability. The Bookham EML10 and EML11 Integrated Electro-absorption laser products use a ridge waveguide structure for the laser and modulator, which provides superior reliability compared to buried heterostructures. It has been subjected to a stringent reliability assurance program, the conclusions of which confirm product reliability exceed the generic requirements of Telcordia GR-468 CORE. More than 965,000 device-hours of data under accelerated life test conditions have been analysed, which for the purpose of characterising random failure rate, is equivalent to 28,300,000 device hours at 25ºC operating temperature [7]. Electro-optic parameters for a 15 year service life at operating temperature of 25ºC have been estimated. The estimated delta over life for specific device parameters is shown in the table below. Parameter Maximum allowed change Change over 15 years @ 25 °C Mean (std. deviation) EA - Extinction rate ER 0.5 dB -0.03 dB (0.2 dB) Laser threshold current 10 % 0.01 % (0.3 %) Laser efficiency 10 % -0.2 % (0.4 %) Laser current for constant output power 10 % 0.2 % (0.4 %) Laser power at constant current (100 mA) 10 % -0.2 % (0.4 %) The reliability failure rate statistics are summarized in the table below. The results are reported for the operation of the device against a laser bias of 100 mA drive current. The resultant low MTTF [8], essentially demonstrating minimal component wear out over the rated 15-year lifetime of the component [7]. Parameter Value Units Median life (ML) at 25°C 528(1) Years σ (standard deviation of the natural logarithms of the TTFs) 0.64 µ (mean of the natural logarithms of the TTFs) 6.27 Maximum wear-out failure rate 0 FITs Average wear-out failure rate over 15 years life 0 FITs Wear-out thermal activation energy 0.5 eV Random failure rate at 25°C at 60% confidence 33 FITs Random failure rate activation energy 0.35 eV Notes: [7] Refer to QR1524, qualification report for the Bookham 10Gb/s Electro-Absorption Modulated Laser. [8] The Bookham policy is to derive random failure rates from actual field data. |
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