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AN273 Datasheet(PDF) 5 Page - Silicon Laboratories

Part # AN273
Description  GR-909 TESTING WITH THE Si321X PROSLIC짰
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Manufacturer  SILABS [Silicon Laboratories]
Direct Link  http://www.silabs.com
Logo SILABS - Silicon Laboratories

AN273 Datasheet(HTML) 5 Page - Silicon Laboratories

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AN273
Rev. 0.1
5
If RSH is not installed, a resistive fault present between TIP and RING will provide enough loop current to cause the
voltage on the TIP lead to drop. Since all of the loop current passes through the resistive fault, RTR, the equation
for RTR becomes as follows:
Equation 5.
4.3. Condition 3: TIP to GND Fault
Resistive faults from TIP to GND are also detected in the TIP-OPEN linefeed state. In this case, the resistive fault
from TIP to GND (RTG) reduces the longitudinal current through RST (see Figure 4); thus, a more positive voltage is
present at the TIP terminal. Equation 6 describes RTG as a function of the TIP and RING voltages. Note that the
denominator is the same as in the RTR calculation; so, the same critical voltage applies.
Figure 4. TIP-OPEN Linefeed State with TIP to GND Resistive Fault
From the voltages measured at TIP and RING, the resistive fault from TIP to GND may be expressed as follows:
Equation 6.
If RSH is not installed, a gross measurement of the impedance from TIP-GND may be made in the FORWARD
ACTIVE linefeed state. By applying a high common-mode voltage to TIP and keeping the differential voltage to 0 V
(VOC = 0), a resistive fault will form a voltage divider along with the 160 Ω output impedance of the TIP lead in the
FORWARD ACTIVE state (see Figure 5).
RTR
RST VRING
VTIP
()
1.5
VTIP
+
---------------------------------------------------------
=
TIP
RING
RST
RSR
RSH
RTG
1.5 V
VOC
RTG
VTIP
RST
×
RSH
×
RSH 1.5 VTIP
+
() R
ST VRING
VTIP
()
-------------------------------------------------------------------------------------------------------------
=


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