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ADS6244IRGZRG4 Datasheet(PDF) 9 Page - Texas Instruments |
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ADS6244IRGZRG4 Datasheet(HTML) 9 Page - Texas Instruments |
9 / 76 page www.ti.com TIMING SPECIFICATIONS (1) ADS6245, ADS6244 ADS6243, ADS6242 SLAS542A – MAY 2007 – REVISED JULY 2007 Typical values are at 25 °C, min and max values are across the full temperature range T MIN = –40°C to TMAX = 85°C, AVDD = LVDD = 3.3 V, maximum rated sampling frequency, sine wave input clock, 1.5 VPP clock amplitude, CL = 5 pF (2), I O = 3.5 mA, RL = 100 Ω (3), no internal termination, unless otherwise noted. ADS6245 ADS6244 ADS6243 ADS6242 TEST PARAMETER UNIT CONDITIONS MIN TYP MAX MIN TYP MAX MIN TYP MAX MIN TYP MAX tJ Aperture jitter Uncertainty in the sampling 250 250 250 250 fs rms instant Interface: 2-wire, DDR bit clock, 14x serialization From data Data setup cross-over to tsu 0.35 0.55 0.45 0.65 0.65 0.85 0.8 1.1 ns time(4) (5)(6) bit clock cross-over From bit clock Data hold cross-over to th 0.35 0.58 0.5 0.7 0.7 0.9 0.8 1.1 ns time(4) (5)(6) data cross-over Input clock rising edge Clock tpd_cl cross-over to propagation 3.4 4.4 5.4 3.4 4.4 5.4 3.4 4.4 5.4 3.4 4.4 5.4 ns k frame clock delay (6) rising edge cross-over Bit clock cycle-cycle 350 350 350 350 ps pp jitter (5) Frame clock cycle-cycle 75 75 75 75 ps pp jitter (5) Below specifications apply for 5 MSPS ≤ Sampling freq ≤ 125 MSPS and all interface options Delay from input clock Aperture rising edge to tA 1 2 3 1 2 3 1 2 3 1 2 3 ns delay the actual sampling instant Aperture Channel- delay channel within –250 ±80 250 –250 ±80 250 –250 ±80 250 –250 ±80 250 ps variation same device Time for a sample to ADC Latency Clock propagate to 12 12 12 12 (7) cycles ADC outputs, see Figure 1 (1) Timing parameters are ensured by design and characterization and not tested in production. (2) CL is the external single-ended load capacitance between each output pin and ground. (3) Io refers to the LVDS buffer current setting; RL is the external differential load resistance between the LVDS output pair. (4) Timing parameters are measured at the end of a 2 inch pcb trace (100- Ω characteristic impedance) terminated by RLand CL. (5) Setup and hold time specifications take into account the effect of jitter on the output data and clock. (6) Refer to Output Timings in application section for timings at lower sampling frequencies and other interface options. (7) Note that the total latency = ADC latency + internal serializer latency. The serializer latency depends on the interface option selected as listed in Table 28. Copyright © 2007, Texas Instruments Incorporated Submit Documentation Feedback 9 Product Folder Link(s): ADS6245 ADS6244 ADS6243 ADS6242 |
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