HCC40105B datasheet(5/12 Pages) STMICROELECTRONICS

Part #	HCC40105B

Description	FIFO REGISTER

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DYNAMIC ELECTRICAL CHARACTERISTICS (T amb =25 °C, CL = 50 pF, RL = 200 kΩ,

typical temperature coefficient for all VDD values is 0.3 %/°C, all input rise and fall time = 20 ns)

Test Conditions

Value

Symbol

Parameter

V DD (V) Min.

Typ.

Max.

Unit

t PHL

Propagation Delay Time

Shift-out or Reset to Data-out

Ready

5

185

370

ns

10

90

180

15

65

130

t PHL

Propagation Delay Time

Shift-in to Data-in Ready

5

160

320

ns

10

65

130

15

45

90

t PZH,tPZL Propagation Delay Time

3-state Control to Data-out

5

140

280

ns

10

60

120

15

40

80

t PHZ,tPLZ Propagation Delay Time

3-State Control to Data-out

5

100

200

ns

10

50

100

15

40

80

t PLH

Ripple-through Delay Input to

Output

52

4

µs

10

1

2

15

0.7

1.4

t THL,tTL H Transition Time

5

100

200

ns

10

50

100

15

40

80

f I

Shift-in or Shift-out Rate

5

1.5

3

MHz

10

3

6

15

4

8

t WH

Shift-in Pulse Width

5

200

100

ns

10

80

40

15

60

30

t WL

Shift-out Pulse Width

5

360

180

ns

10

160

80

15

100

50

t r

Shift-in or Shift-out Rise Time

5

15

µs

10

15

t f

Shift-in Fall Time

5

15

µs

10

15

t f

Shift-out Fall Time

5

15

µs

10

5

15

5

t se tup

Data Setup Time

5

0

ns

10

0

15

0

HCC/HCF40105B

5/12

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