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IRM-36XXT Datasheet(PDF) 9 Page - Everlight Electronics Co., Ltd |
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IRM-36XXT Datasheet(HTML) 9 Page - Everlight Electronics Co., Ltd |
9 / 10 page EVERLIGHT ELECTRONICS CO.,LTD. Everlight Electronics Co., Ltd. http:\\www.everlight.com Rev 1 Page: 9 of 10 Device No :SZDMO-036-077 Prepared date :2-Mar-2007 Prepared by : Zhang Meijuan Ambient Temperature Ta (°C) 7.0 3.5 14.0 10.5 17.5 IRM-36xxT SERIES Typical Electro-Optical Characteristics Curves Fig.-9 Arrival Distance vs. Ambient Temperature Reliability Test Item And Condition The reliability of products shall be satisfied with items listed below. Confidence level:90% LTPD:10% Test Items Test Conditions Failure Judgement Criteria Samples(n) Defective(c) Temperature cycle 1 cycle -40℃ +100℃ (15min)(5min)(15min) 300 cycle test n=22,c=0 High temperature test Temp: +100℃ Vcc:6V 1000hrs n=22,c=0 Low temperature storage Temp: -40℃ 1000hrs n=22,c=0 High temperature High humidity Ta: 85℃,RH:85% 1000hrs n=22,c=0 Solder heat Temp: 260±5℃ 10sec 4mm From the bottom of the package. L0≦ L×0.8 L45≦ L×0.8 L: Lower specification limit n=22,c=0 |
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