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CAT5251WI-50 Datasheet(PDF) 6 Page - Catalyst Semiconductor |
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CAT5251WI-50 Datasheet(HTML) 6 Page - Catalyst Semiconductor |
6 / 15 page CAT5251 Doc. No. MD-2017 Rev. F 6 © Catalyst Semiconductor, Inc. Characteristics subject to change without notice WRITE CYCLE LIMITS Over recommended operating conditions unless otherwise stated. Symbol Parameter Min Typ Max Units tWR Write Cycle Time 5 ms RELIABILITY CHARACTERISTICS Over recommended operating conditions unless otherwise stated. Symbol Parameter Reference Test Method Min Typ Max Units NEND (1) Endurance MIL-STD-883, Test Method 1033 1,000,000 Cycles/Byte TDR (1) Data Retention MIL-STD-883, Test Method 1008 100 Years VZAP (1) ESD Susceptibility MIL-STD-883, Test Method 3015 2000 V ILTH (1) Latch-Up JEDEC Standard 17 100 mA Figure 1. Sychronous Data Timing Note: Dashed Line = mode (1, 1) Figure 2. HOLD ¯¯¯¯¯ Timing Notes: (1) This parameter is tested initially and after a design or process change that affects the parameter. VALID IN VIH VIL IL VIH VIL VIH V VOH VOL HI-Z tSU tH tWH tWL tV tCS tCSH tHO tDIS HI-Z SCK SI SO tRI tFI tCSS CS CS SCK HOLD SO tCD tHD tHD tCD tLZ tHZ HIGH IMPEDANCE |
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