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CAT5411YI-10 Datasheet(PDF) 3 Page - Catalyst Semiconductor

Part # CAT5411YI-10
Description  Dual Digitally Programmable Potentiometers (DPP?? with 64 Taps and SPI Interface
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Manufacturer  CATALYST [Catalyst Semiconductor]
Direct Link  http://www.catalyst-semiconductor.com
Logo CATALYST - Catalyst Semiconductor

CAT5411YI-10 Datasheet(HTML) 3 Page - Catalyst Semiconductor

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CAT5411
© Catalyst Semiconductor, Inc.
3
Doc. No. MD-2114 Rev. I
Characteristics subject to change without notice
DEVICE OPERATION
The CAT5411 is two resistor arrays integrated with
SPI serial interface logic, four 6-bit wiper control
registers and eight 6-bit, non-volatile memory data
registers. Each resistor array contains 63 separate
resistive elements connected in series. The physical
ends of each array are equivalent to the fixed
terminals of a mechanical potentiometer (RH and RL).
RH and RL are symmetrical and may be interchanged.
The tap positions between and at the ends of the
series resistors are connected to the output wiper
terminals (RW) by a CMOS transistor switch. Only one
tap point for each potentiometer is connected to its
wiper terminal at a time and is determined by the
value of the wiper control register. Data can be read
or written to the wiper control registers or the non-
volatile memory data registers via the SPI bus.
Additional instructions allow data to be transferred
between the wiper control registers and each
respective potentiometer's non-volatile data registers.
Also, the device can be instructed to operate in an
"increment/decrement" mode.
SERIAL BUS PROTOCOL
The CAT5041 supports the SPI bus data transmission
protocol. The synchronous Serial Peripheral Interface
(SPI) helps the CAT5411 to interface directly with
many
of
today's
popular
microcontrollers.
The CAT5041 contains an 8-bit instruction register.
The instruction set and the operation codes are
detailed in the instruction set table 3.
After the device is selected with CS
¯¯¯ going low the first
byte will be received. The part is accessed via the SI
pin, with data being clocked in on the rising edge of
SCK. The first byte contains one of the six op-codes
that define the operation to be performed.
RELIABILITY CHARACTERISTICS
Over recommended operating conditions unless otherwise stated.
Symbol
Parameter
Reference Test Method
Min
Typ
Max
Units
NEND
(1)
Endurance
MIL-STD-883, Test Method 1033
1,000,000
Cycles/Byte
TDR
(1)
Data Retention
MIL-STD-883, Test Method 1008
100
Years
VZAP
(1)
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
Volts
ILTH
(1)
Latch-Up
JEDEC Standard 17
100
mA
Notes:
(1) This parameter is tested initially and after a design or process change that affects the parameter.


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