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LM78LM08S8-XX-BL Datasheet(PDF) 7 Page - TAITRON Components Incorporated |
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LM78LM08S8-XX-BL Datasheet(HTML) 7 Page - TAITRON Components Incorporated |
7 / 15 page 200mA Positive Voltage Regulator Rev. A/DX 2007-06-04 LM78LM www.taitroncomponents.com Page 7 of 15 For LM78LM18 (VIN=27V, IOUT=40mA, 0° C<TJ<125° C, C1=0.33µF, CO=0.1µF, unless otherwise specified) LM78LM18 Symbol Description Min. Typ. Max. Unit Test Conditions 17.28 18.00 18.72 V TJ=25℃ 17.10 - 18.90 V 21V≤VIN≤33V, IOUT=1mA-40mA VOUT Output Voltage 17.10 - 18.90 V 21V≤VIN≤VMAX, IOUT=1mA- 200mA, Power Dissipation<0.5W - 30 170 mV TJ=25℃, 1mA≤IOUT≤100mA ∆VOUT Load Regulation - 15 85 mV TJ=25℃, 1mA≤IOUT≤40mA - 145 300 mV TJ=25℃, 21V≤VIN≤33V ∆VOUT Line Regulation - 135 250 mV TJ=25℃, 22V≤VIN≤33V IQ Quiescent Current - 2.0 6.0 mA - - 1.5 mA 21V≤VIN≤33V ∆IQ Quiescent Current Change - - 0.1 mA 1mA≤IIN≤40mA eN Output Noise Voltage - 150 - µV 10Hz≤f≤100KHz ∆VO/∆T Temperature coefficient of VOUT - -1.8 - mV/℃ IOUT=5mA RR Ripple Rejection 34 48 - dB 23V≤VIN≤33V, f=120Hz, TJ=25℃ VD Dropout Voltage - 1.7 - V TJ=25℃ For LM78LM24 (VIN=33V, IOUT=40mA, 0° C<TJ<125° C, C1=0.33µF, CO=0.1µF, unless otherwise specified) LM78LM24 Symbol Description Min. Typ. Max. Unit Test Conditions 23.04 24.00 24.96 V TJ=25℃ 22.80 - 25.20 V 27V≤VIN≤38V, IOUT=1mA-40mA VOUT Output Voltage 22.80 - 25.20 V 27V≤VIN≤VMAX, IOUT=1mA- 200mA, Power Dissipation<0.5W - 40 200 mV TJ=25℃, 1mA≤IOUT≤100mA ∆VOUT Load Regulation - 20 100 mV TJ=25℃, 1mA≤IOUT≤40mA - 160 300 mV TJ=25℃, 27V≤VIN≤38V ∆VOUT Line Regulation - 150 250 mV TJ=25℃, 28V≤VIN≤38V IQ Quiescent Current - 2.2 6.0 mA - - 1.5 mA 27V≤VIN≤38V ∆IQ Quiescent Current Change - - 0.1 mA 1mA≤IIN≤40mA eN Output Noise Voltage - 200 - µV 10Hz≤f≤100KHz ∆VO/∆T Temperature coefficient of VOUT - -2.0 - mV/℃ IOUT=5mA RR Ripple Rejection 34 45 - dB 27V≤VIN≤38V, f=120Hz, TJ=25℃ VD Dropout Voltage - 1.7 - V TJ=25℃ Note: The maximum steady state usable output current is dependent on input voltage, heat sinking, lead length of the package and copper pattern of PCB. The data above represent pulse test conditions with junction temperatures specified at the initiation of test. |
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