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LMC7221BIM Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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LMC7221BIM Datasheet(HTML) 4 Page - National Semiconductor (TI) |
4 / 13 page AC Electrical Characteristics Unless otherwise specified, all limits guaranteed for T J = 25˚C, V + = 5V, V− = 0V, V CM =VO =V +/2. Boldface limits apply at the temperature extreme. Typ LMC7221AI LMC7221BI Symbol Parameter Conditions (Note 5) Limit Limit Units (Note 6) (Note 6) t rise Rise Time f = 10 kHz, C L = 50 pF, (Note 8) 0.3 µs Overdrive = 10 mV, 5 k Ω Pullup t fall Fall Time f = 10 kHz, C L = 50 pF, (Note 8) 0.3 µs Overdrive = 10 mV, 5 k Ω Pullup t PHL Propagation Delay (High to Low) (Note 10) f = 10 kHz, C L =50pF, 5k Ω Pullup (Note 8) 10 mV 10 µs 100 mV 4 V + = 2.7V,f=10 kHz, C L =50pF,5k Ω Pullup (Note 8) 10 mV 10 µs 100 mV 4 t PLH Propagation Delay (Low to High) (Note 10) f = 10 kHz, C L =50pF, 5k Ω Pullup (Note 8) 10 mV 6 µs 100 mV 4 V + = 2.7V,f=10 kHz, C L =50pF,5k Ω Pullup (Note 8) 10 mV 7 µs 100 mV 4 Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics. Note 2: Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of JEDEC) Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC). Note 3: Applies to both single-supply and split-supply operation. Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed junction temperature of 150˚C. Output currents in excess of ±30 mA may adversely affect reliability. Note 4: The maximum power dissipation is a function of TJ(MAX), θJA. The maximum allowable power dissipation at any ambient temperature is PD =(TJ(MAX) –TA)/ θJA. All numbers apply for packages soldered directly onto a PC Board. Note 5: Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material. Note 6: All limits are guaranteed by testing or statistical analysis. Note 7: Limiting input pin current is only necessary for input voltages which exceed the absolute maximum input voltage rating. Note 8: Do not short circuit the output to V+ when V+ is greater than 12V or reliability will be adversely affected. Note 9: CL includes the probe and test jig capacitance. Note 10: Input offset voltage average drift is calculated by dividing the accelerated operating life VOS drift by the equivalent operational time. This represents worst case input conditions and includes the first 30 days of drift. Note 11: Input step voltage for propagation delay measurement is 2V. www.national.com 4 |
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