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ISPLSI2192VE Datasheet(HTML) 4 Page - Lattice Semiconductor

Part No. ISPLSI2192VE
Description  3.3V In-System Programmable SuperFAST™ High Density PLD
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Maker  LATTICE [Lattice Semiconductor]
Homepage  http://www.latticesemi.com
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ISPLSI2192VE Datasheet(HTML) 4 Page - Lattice Semiconductor

 
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Specifications ispLSI 2192VE
4
Switching Test Conditions
Figure 2. Test Load
Input Pulse Levels
Table 2-0003/2192VE
Input Rise and Fall Time
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
GND to 3.0V
≤ 1.5ns 10% to 90%
1.5V
1.5V
See Figure 2
3-state levels are measured 0.5V from steady-state active level.
DC Electrical Characteristics
Over Recommended Operating Conditions
Output Load Conditions (see Figure 2)
TEST CONDITION
R1
R2
CL
A
316Ω
348Ω
35pF
B
348Ω
35pF
316Ω
348Ω
35pF
Active High
Active Low
C
316Ω
348Ω
5pF
348Ω
5pF
Active Low to Z
at V +0.5V
OL
Active High to Z
at V
-0.5V
OH
Table 2-0004/2192VE
VOL
SYMBOL
1. One output at a time for a maximum duration of one second. V
= 0.5V was selected to avoid test
problems by tester ground degradation. Characterized but not 100% tested.
2. Measured using twelve 16-bit counters.
3. Typical values are at V = 3.3V and T = 25°C.
4. Maximum I
varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum I
.
Table 2-0007/2192VE
1
VOH
IIH
IIL
IIL-isp
PARAMETER
IIL-PU
IOS
2, 4
ICC
Output Low Voltage
Output High Voltage
Input or I/O High Leakage Current
Input or I/O Low Leakage Current
BSCAN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
I = 8 mA
I
= -4 mA
0V ≤ V ≤ V (Max.)
0V ≤ V ≤ V
0V ≤ V ≤ V
V = 3.3V, V
= 0.5V
V = 0.0V, V = 3.0V
f
= 1 MHz
OL
OH
IN
IL
IN
IL
IN
IL
CC
OUT
CLOCK
IL
IH
CONDITION
MIN.
TYP.
MAX.
UNITS
3
2.4
275
0.4
10
10
-10
-150
-150
-100
V
V
µA
µA
µA
µA
µA
mA
mA
CC
A
OUT
CC
CC
(V
- 0.2)V ≤ V ≤ V
V ≤ V ≤ 5.25V
CC
CC
IN
IN
CC
+ 3.3V
R1
R2
CL*
Device
Output
Test
Point
*CL includes Test Fixture and Probe Capacitance.
0213A/2192VE


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