 |
Electronic Components Datasheet Search |
|
|
Electronic Components Datasheet Search |
|
LC4256ZC-75TN176C Datasheet(PDF) 13 Page - Lattice Semiconductor |
|
||||||||||||||||||||||||||||||
LC4256ZC-75TN176C Datasheet(HTML) 13 Page - Lattice Semiconductor |
|
|
13 / 99 page  Lattice Semiconductor ispMACH 4000V/B/C/Z Family Data Sheet 13 Figure 10. Global OE Generation for ispMACH 4032 Zero Power/Low Power and Power Management The ispMACH 4000 family is designed with high speed low power design techniques to offer both high speed and low power. With an advanced E 2 low power cell and non sense-amplifier design approach (full CMOS logic approach), the ispMACH 4000 family offers SuperFAST pin-to-pin speeds, while simultaneously delivering low standby power without needing any “turbo bits” or other power management schemes associated with a traditional sense-amplifier approach. The zero power ispMACH 4000Z is based on the 1.8V ispMACH 4000C family. With innovative circuit design changes, the ispMACH 4000Z family is able to achieve the industry’s “lowest static power”. IEEE 1149.1-Compliant Boundary Scan Testability All ispMACH 4000 devices have boundary scan cells and are compliant to the IEEE 1149.1 standard. This allows functional testing of the circuit board on which the device is mounted through a serial scan path that can access all critical logic notes. Internal registers are linked internally, allowing test data to be shifted in and loaded directly onto test nodes, or test node data to be captured and shifted out for verification. In addition, these devices can be linked into a board-level serial scan path for more board-level testing. The test access port operates with an LVCMOS interface that corresponds to the power supply voltage. I/O Quick Configuration To facilitate the most efficient board test, the physical nature of the I/O cells must be set before running any continu- ity tests. As these tests are fast, by nature, the overhead and time that is required for configuration of the I/Os’ physical nature should be minimal so that board test time is minimized. The ispMACH 4000 family of devices allows this by offering the user the ability to quickly configure the physical nature of the I/O cells. This quick configuration takes milliseconds to complete, whereas it takes seconds for the entire device to be programmed. Lattice's ispVM ® System programming software can either perform the quick configuration through the PC parallel port, or can gen- erate the ATE or test vectors necessary for a third-party test system. Shared PTOE (Block 0) Shared PTOE (Block 1) Global Fuses GOE (3:0) to I/O cells Internal Global OE PT Bus (2 lines) 4-Bit Global OE Bus Global OE Fuse connection Hard wired |
Similar Part No. - LC4256ZC-75TN176C |
|
Similar Description - LC4256ZC-75TN176C |
|
|
Link URL |
| Privacy Policy |
| ALLDATASHEET.NET |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
English ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
