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74LVT273PW Datasheet(PDF) 10 Page - NXP Semiconductors |
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74LVT273PW Datasheet(HTML) 10 Page - NXP Semiconductors |
10 / 17 page 74LVT273_3 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 03 — 10 September 2008 10 of 17 NXP Semiconductors 74LVT273 3.3 V octal D-type flip-flop Test data is given in given in Table 9. Definitions for test circuit: RL = Load resistance; CL = Load capacitance including jig and probe capacitance; RT = Termination resistance should be equal to output impedance Zo of the pulse generator. Fig 9. Load circuitry for switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aaf615 VCC VI VO DUT CL RT RL PULSE GENERATOR Table 9. Test data Input Load VI Repetition rate tW tr, tf RL CL 2.7 V ≤ 10 MHz 500 ns ≤ 2.5 ns 500 Ω 50 pF |
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