OPA659

OPA659

TEST

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNIT

AC PERFORMANCE

Small-Signal Bandwidth

650

MHz

C

335

MHz

C

75

MHz

C

35

MHz

C

Gain Bandwidth Product

G > +10V/V

350

MHz

C

Bandwidth for 0.1dB Flatness

55

MHz

C

Large-Signal Bandwidth

575

MHz

B

Slew Rate

2550

V/

µs

B

Rise and Fall Time

1.3

ns

C

Settling Time to 1%

8

ns

C

Pulse Response Overshoot

12

%

C

Harmonic Distortion

2nd harmonic

–79

dBc

C

3rd harmonic

–100

dBc

C

Intermodulation Distortion

2nd intermodulation

–72

dBc

C

3rd intermodulation

–96

dBc

C

Input Voltage Noise

f > 100kHz

8.9

nV/

√Hz

C

Input Current Noise

f < 10MHz

1.8

fA/

√Hz

C

DC PERFORMANCE

52

58

dB

A

49

55

dB

B

Input Offset Voltage

±1

±5

mV

A

±1.5

±7.6

mV

B

Average Offset Voltage Drift

±10

±40

µV/°C

B

Input Bias Current

±10

±50

pA

A

±240

±1200

pA

B

±640

±3200

pA

B

±5

±26

pA/°C

B

Average input bias current drift

±7

±34

pA/°C

B

Input Offset Current

±5

±25

pA

A

±120

±600

pA

B

±320

±1600

pA

B

INPUT

Common-Mode Input Range

±3

±3.5

V

A

±2.87

±3.37

V

B

Common-Mode Rejection Ratio

68

70

dB

A

64

66

dB

B

Input Impedance

Differential

Ω

pF

C

1

Common-mode

Ω

pF

C

2.5

(1)

Test levels: (A) 100% tested at +25°C. Over temperature limits set by characterization and simulation. (B) Limits set by characterization

and simulation. (C) Typical value only for information.

Copyright © 2008, Texas Instruments Incorporated

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