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TC55RP2101EMB Datasheet(PDF) 3 Page - TelCom Semiconductor, Inc

Part # TC55RP2101EMB
Description  LOW DROPOUT POSITIVE VOLTAGE REGULATOR
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Manufacturer  TELCOM [TelCom Semiconductor, Inc]
Direct Link  http://www.telcom-semi.com
Logo TELCOM - TelCom Semiconductor, Inc

TC55RP2101EMB Datasheet(HTML) 3 Page - TelCom Semiconductor, Inc

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4-129
TELCOM SEMICONDUCTOR, INC.
7
6
5
4
3
1
2
8
TC55 Series
LOW DROPOUT
POSITIVE VOLTAGE REGULATOR
TC55RP30 ELECTRICAL CHARACTERISTICS: VOUT(S) = 5.0V, TA = 25°C unless otherwise specified (see REMARKS).
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
VOUT(A)
Output Voltage
IOUT = 40mA
V
VIN = 4.0V
2.94
3.0
3.06
IOUTmax
Maximum Output Current
VIN = 4.0V, VOUT(A) ≥ 2.7V
150
mA
∆VOUT
Load Regulation
VIN = 4.0V, 1 mA ≤ IOUT ≤ 80mA
45
90
mV
Vdif
I/O Voltage Difference
IOUT = 80mA
180
360
mV
IOUT = 160mA
400
700
ISS
Current Consumption
VIN = 4.0V
0.9
2.8
µA
VOUT(A)·100
Voltage Regulation
IOUT = 40mA
0.2
0.3
%/V
∆VIN·VOUT(S)
4.0V
≤ VIN ≤ 10.0V
VIN
Input Voltage
10.0
V
∆VOUT(A)·106
Temperature Coefficient
IOUT = 40mA
±100
ppm/
°C
∆TA·VOUT(S)
of Output Voltage
– 40
°C ≤ TA ≤ 85°C
Long Term Stability
TA = 125°C, 1000 Hours
0.5
%
MARKING
SOT-23A-3
SOT-89-3
x

Ž

x  Ž 
TO-92-3
8
12
4
7
11
3
6
10
2
5
9
1
represents first voltage digit
2
3456
ex: 3.xV =
kkkk
represents first decimal place voltage (x.0 - x.9)
A = x.0
E = x.4
L = x.8
B = x.1
F = x.5
M = x.9
C = x.2
H = x.6
D = x.3
K = x.7
ex: 3.4V =
kkkk
represents Polarity
0 = Positive (fixed)
represents assembly lot number
3
3E
,
,
&
= 55RP (fixed)
= first voltage digit (2-6)
= first voltage decimal (0-9)
= extra feature code : fixed : 0
= regulation accuracy
1 =
±1.0% (custom), 2 = ±2.0% (standard)
,
,
&
= assembly lot number
*Static-sensitive device. Unused devices must be stored in conductive material. Protect devices from static discharge and static fields. Stresses above those
listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device
at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to Absolute Maximum Rating
Conditions for extended periods may affect device reliability.


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