SN54BCT8373A, SN74BCT8373A

SCAN TEST DEVICES

WITH OCTAL D-TYPE LATCHES

SCBS044F – JUNE 1990 – REVISED JULY 1996

2

POST OFFICE BOX 655303

description (continued)

Four dedicated test terminals are used to control the operation of the test circuitry: test data input (TDI), test

data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform

other testing functions such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern

generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

The SN54BCT8373A is characterized for operation over the full military temperature range of – 55

°C to 125°C.

The SN74BCT8373A is characterized for operation from 0

°C to 70°C.

FUNCTION TABLE

(normal mode, each latch)

INPUTS

OUTPUT

OE

LE

D

Q

L

H

H

H

L

HL

L

L

LX

Q0

H

X

X

Z

SCAN

’BCT8373A

1D

23

1D

1Q

2

TDI

14

TDI

TCK-IN

EN

24

22

2D

2Q

3

TMS

12

TMS

13

TCK

C1

1

LE

TCK-OUT

21

3D

3Q

4

20

4D

4Q

5

19

5D

5Q

7

17

6D

6Q

8

16

7D

7Q

9

15

8D

8Q

10

OE

Φ

TDO

11

TDO

† This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.

Pin numbers shown are for the DW, JT, and NT packages.