ADP3121JCPZ-RL datasheet(4/10 Pages) ONSEMI

Part #	ADP3121JCPZ-RL

Description	Dual Bootstrapped, 12 V MOSFET Driver with Output Disable

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ADP3121

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ELECTRICAL CHARACTERISTICS (VCC = 12 V, BST = 4 V to 26 V, TA = 0°C to 85°C, unless otherwise noted) (Note 5)

Characteristic

Test Conditions

Symbol

Min

Typ

Max

Unit

SUPPLY

Supply Voltage Range

VCC

4.15

13.2

V

Supply Current

BST = 12 V, IN = 0 V

ISYS

2

5

mA

OD INPUTS

Input Voltage High

2.0

V

Input Voltage Low

0.8

V

Input Current

−1

+1

mA

Hysteresis

90

250

mV

PWM INPUTS

Input Voltage High

2.0

V

Input Voltage Low

0.8

V

Input Current

−1

+1

mA

Hysteresis

90

250

mV

HIGH−SIDE DRIVER

Output Resistance, Sourcing Current

BST − SW = 12 V; TA = 25°C

2.3

W

BST − SW = 12 V; TA = 0°C to 85°C

1.7

2.8

W

Output Resistance, Sinking Current

BST – SW = 12 V; TA = 25°C

2.3

W

BST − SW = 12 V; TA = 0°C to 85°C

1.7

2.8

W

Output Resistance, Unbiased

BST – SW = 0 V

10

kW

Transition Times

BST – SW = 12 V, CLOAD = 3 nF,

see Figure 4

trDRVH

20

32

ns

BST – SW = 12 V, CLOAD = 3 nF,

see Figure 4

tfDRVH

20

30

ns

Propagation Delay Times

BST – SW = 12 V, CLOAD = 3 nF

tpdhDRVH

20

30

50

ns

25°C ≤ TA ≤ 85°C, see Figure 4

BST – SW = 12 V, CLOAD = 3 nF,

see Figure 4

tpdlDRVH

32

47

ns

See Figure 3

tpdlOD

30

45

ns

See Figure 3

tpdhOD

20

40

ns

SW Pull−Down Resistance

SW to PGND

10

kW

LOW−SIDE DRIVER

Output Resistance, Sourcing Current

TA = 25°C

2.4

W

TA = 0°C to 85°C

1.8

2.8

W

Output Resistance, Sinking Current

TA = 25°C

1.6

W

TA = 0°C to 85°C

1.0

1.8

W

Output Resistance, Unbiased

VCC = PGND

10

kW

Transition Times

CLOAD = 3 nF, see Figure 4

trDRVL

20

30

ns

CLOAD = 3 nF, see Figure 4

tfDRVL

10

20

ns

Propagation Delay Times

CLOAD = 3 nF, see Figure 4

tpdhDRVL

15

35

ns

CLOAD = 3 nF, see Figure 4

tpdlDRVL

17

32

ns

See Figure 3

tpdlOD

37

52

ns

See Figure 3

tpdhOD

100

180

ns

5. ALL limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC) methods

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