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SN54LVTH18652A Datasheet(PDF) 2 Page - Texas Instruments

Part # SN54LVTH18652A
Description  3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

SN54LVTH18652A Datasheet(HTML) 2 Page - Texas Instruments

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SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT TRANSCEIVERS AND REGISTERS
SCBS312C – MARCH 1994 – REVISED JUNE 1997
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
In the test mode, the normal operation of the SCOPE bus transceivers and registers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry
performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990.
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI),
test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs
other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern
generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The B-port outputs of ’LVTH182652A, which are designed to source or sink up to 12 mA, include equivalent 25-
series resistors to reduce overshoot and undershoot.
The SN54LVTH18652A and SN54LVTH182652A are characterized for operation over the full military
temperature range of –55
°C to 125°C. The SN74LVTH18652A and SN74LVTH182652A are characterized for
operation from –40
°C to 85°C.
1B4
1B5
1B6
GND
1B7
1B8
1B9
VCC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
VCC
2A1
2A2
2A3
GND
2A4
2A5
2A6
SN54LVTH18652A, SN54LVTH182652A . . . HV PACKAGE
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NC – No internal connection


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