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CAT5112VI-10-G Datasheet(PDF) 3 Page - ON Semiconductor |
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CAT5112VI-10-G Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 11 page CAT5112 © 2008 SCILLC. All rights reserved. 3 Doc. No. MD-2002 Rev. N Characteristics subject to change without notice OPERATION MODES INC ¯¯¯ CS ¯¯ U/D ¯ Operation High to Low Low High Wiper toward RH High to Low Low Low Wiper toward RL High Low to High X Store Wiper Position Low Low to High X No Store, Return to Standby X High X Standby ABSOLUTE MAXIMUM RATINGS (1) Parameters Ratings Units Supply Voltage VCC to GND -0.5 to +7V V Inputs CS ¯¯ to GND -0.5 to VCC +0.5 V INC ¯¯¯ to GND -0.5 to VCC +0.5 V U/D ¯ to GND -0.5 to VCC +0.5 V RH to GND -0.5 to VCC +0.5 V RL to GND -0.5 to VCC +0.5 V RWB to GND -0.5 to VCC +0.5 V Parameters Ratings Units Operating Ambient Temperature Commercial (‘C’ or Blank suffix) 0 to 70 ºC Industrial (‘I’ suffix) -40 to +85 ºC Junction Temperature +150 ºC Storage Temperature -65 to 150 ºC Lead Soldering (10s max) +300 ºC RELIABILITY CHARACTERISTICS Symbol Parameter Test Method Min Typ Max Units VZAP (2) ESD Susceptibility MIL-STD-883, Test Method 3015 2000 V ILTH (2) (3) Latch-Up JEDEC Standard 17 100 mA TDR Data Retention MIL-STD-883, Test Method 1008 100 Years NEND Endurance MIL-STD-883, Test Method 1003 1,000,000 Stores DC ELECTRICAL CHARACTERISTICS VCC = +2.5V to +6V unless otherwise specified Power Supply Symbol Parameter Conditions Min Typ Max Units VCC Operating Voltage Range 2.5 – 6 V VCC = 6V, f = 1MHz, IW = 0 – – 200 µA ICC1 Supply Current (Increment) VCC = 6V, f = 250kHz, IW = 0 – – 100 µA Programming, VCC = 6V – – 1000 µA ICC2 Supply Current (Write) VCC = 3V – – 500 µA ISB1 (3) Supply Current (Standby) CS ¯¯ = VCC - 0.3V U/D ¯, INC ¯¯¯ = VCC - 0.3V or GND – 75 150 µA Notes: (1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. (2) This parameter is tested initially and after a design or process change that affects the parameter. (3) Latch-up protection is provided for stresses up to 100mA on address and data pins from -1V to VCC + 1V (4) IW = source or sink (5) These parameters are periodically sampled and are not 100% tested. CH RH RWI RWB Potentiometer Equivalent Circuit CW CL RL |
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