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CAT5411YI-10 Datasheet(PDF) 6 Page - ON Semiconductor |
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CAT5411YI-10 Datasheet(HTML) 6 Page - ON Semiconductor |
6 / 16 page CAT5411 Doc. No. MD-2114 Rev. K 6 © 2008 SCILLC. All rights reserved. Characteristics subject to change without notice ELECTRICAL CHARACTERISTICS Over recommended operating conditions unless otherwise stated. Symbol Parameter Min Typ Max Units Test Conditions tSU Data Setup Time 50 ns tH Data Hold Time 50 ns tWH SCK High Time 125 ns tWL SCK Low Time 125 ns fSCK Clock Frequency DC 3 MHz tLZ HOLD ¯¯¯¯¯ to Output Low Z 50 ns tRI (1) Input Rise Time 2 µs tFI (1) Input Fall Time 2 µs tHD HOLD ¯¯¯¯¯ Setup Time 100 ns CL = 50pF tCD HOLD ¯¯¯¯¯ Hold Time 100 ns tWC Write Cycle Time 5 ms tV Output Valid from Clock Low 250 ns tHO Output Hold Time 0 ns tDIS Output Disable Time 250 ns tHZ HOLD ¯¯¯¯¯ to Output High Z 100 ns tCS CS ¯¯¯ High Time 250 ns tCSS CS ¯¯¯ Setup Time 250 ns tCSH CS ¯¯¯ Hold Time 250 ns POTENTIOMETER AC CHARACTERISTICS Symbol Parameter Max Units tWRL Wiper response time after instruction issued (all load instructions) 10 µs tWRID Wiper response time from an active SCK edge (Increment/decrement instruction) 5 µs Note: (1) This parameter is tested initially and after a design or process change that affects the parameter. |
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