TC211

192-

× 165-PIXEL CCD IMAGE SENSOR

SOCS008B – JANUARY 1990

2-6

POST OFFICE BOX 655303

PARAMETER

MIN

TYP†

MAX

UNIT

Dynamic range (see Note 2)

Antiblooming disabled (see Note 3)

60

dB

Dynamic range (see Note 2)

Antiblooming enabled

57

dB

Charge conversion factor

4

µV/e

Charge transfer efficiency (see Note 4)

0.99990

0.99998

Signal response delay time,

τ (see Note 5 and Figure 5)

25

ns

Gamma (see Note 6)

0.97

0.98

0.99

Output resistance

700

800

Ω

Noise voltage

1/f noise (5 kHz)

370

nV/

√Hz

Noise voltage

Random noise, f = 100 kHz

70

nV/

√Hz

Noise equivalent signal

150

electrons

Rejection ratio at 7 16 MHz

From ADB to OUT (see Note 7)

19

dB

Rejection ratio at 7.16 MHz

From SRG to OUT (see Note 8)

37

dB

Supply current

5

10

mA

IAG

1600

Input capacitance, Ci

SRG

25

pF

ABG

780

† All typical values are at TA = 25°C

NOTES:

2. Dynamic range is – 20 times the logarithm of the mean noise signal divided by the saturation output signal.

3. For this test, the antiblooming gate must be biased at the intermediate level.

4. Charge transfer efficiency is one minus the charge loss per transfer in the output register. The test is performed in the dark using

an electrical input signal.

5. Signal response delay time is the time between the falling edge of the SRG clock pulse and the output signal valid state.

6. Gamma (

γ) is the value of the exponent in the equation below for two points on the linear portion of the transfer function curve (this

value represents points near saturation):

Exposure (2)

Exposure (1)

g

+

Output signal (2)

Output signal (1)

7. ADB rejection ratio is – 20 times the logarithm of the ac amplitude at the OUT divided by the ac amplitude at ADB.

8. SRG rejection ratio is – 20 times the logarithm of the ac amplitude at the OUT divided by the ac amplitude at SRG.