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TLC1541IFN Datasheet(PDF) 6 Page - Texas Instruments |
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TLC1541IFN Datasheet(HTML) 6 Page - Texas Instruments |
6 / 11 page TLC1541 10-BIT ANALOG-TO-DIGITAL CONVERTER WITH SERIAL CONTROL AND 11 INPUTS SLAS073C – DECEMBER 1995 – REVISED AUGUST 1996 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 operating characteristics over recommended operating temperature range, VCC = Vref+ = 4.75 V to 5.5 V, fclock(I/O) = 1.1 MHz, fclock(SYS) = 2.1 MHz PARAMETER TEST CONDITIONS MIN MAX UNIT EL Linearity error See Note 5 ±1 LSB EZS Zero-scale error See Notes 2 and 6 ±1 LSB EFS Full-scale error See Notes 2 and 6 ±1 LSB ET Total unadjusted error See Note 7 ±1 LSB Self-test output code Input A11 address = 1011 (see Note 8) 0111110100 (500) 1000001100 (524) tconv Conversion time 21 µs Total access and conversion time 31 µs Channel acquisition time (sample cycle) See Operating Sequence 6 I/O clock cycles tv Time output data remains valid after I/O CLOCK ↓ 10 ns td Delay time, I/O CLOCK ↓ to DATA OUT valid 400 ns ten Output enable time 150 ns tdis Output disable time See Figure 1 150 ns tr(bus) Data bus rise time 300 ns tf(bus) Data bus fall time 300 ns NOTES: 2. Analog input voltages greater than that applied to REF + convert as all ones (1111111111), while input voltages less than that applied to REF – convert as all zeros (0000000000). For proper operation, REF + voltage must be at least 1 V higher than REF – voltage. Also, the total unadjusted error may increase as this differential reference voltage falls below 4.75 V. 5. Linearity error is the maximum deviation from the best straight line through the A/D transfer characteristics. 6. Zero-scale error is the difference between 0000000000 and the converted output for zero input voltage; full-scale error is the difference between 1111111111 and the converted output for full-scale input voltage. 7. Total unadjusted error includes linearity, zero-scale, and full-scale errors. 8. Both the input address and the output codes are expressed in positive logic. The A11 analog input signal is internally generated and used for test purposes. |
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