TLC354

LinCMOS

™ QUADRUPLE DIFFERENTIAL COMPARATORS

SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997

9

POST OFFICE BOX 655303

PARAMETER MEASUREMENT INFORMATION

Response time is defined as the interval between the application of an input step function and the instant when the

output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the trailing

edge of the input pulse. Response-time measurement at low input signal levels can be greatly affected by the input

offset voltage. The offset voltage should be balanced by the adjustment at the inverting input (as shown in Figure 3)

so that the circuit is just at the transition point. Then a low signal, for example, 105-mV or 5-mV overdrive, causes

the output to change.

50%

OUT

5.1 k

Ω

1

µF

VDD

Pulse Generator

CL

(see Note A)

50

Ω

1 k

Ω

0.1

µF

TEST CIRCUIT

10

Ω

10 Turn

1 V

–1 V

Input

Offset Voltage

Compensation

Adjustment

VOLTAGE WAVEFORMS

tPLH

tr

10%

90%

100 mV

Overdrive

Input

Low-to-High-

Level Ouptut

50%

tPLH

tf

10%

90%

100 mV

Overdrive

Input

High-to-Low-

Level Ouptut

NOTE A: CL includes probe and jig capacitance.

Figure 3. Response, Rise, and Fall Times Test Circuit and Voltage Waveforms