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TLV5510INS Datasheet(PDF) 11 Page - Texas Instruments |
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TLV5510INS Datasheet(HTML) 11 Page - Texas Instruments |
11 / 19 page TLV5510 2.7-V TO 3.6-V 8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTER SLAS124C– DECEMBER 1997 – REVISED DECEMBER 1999 11 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 APPLICATION INFORMATION The following notes are design recommendations that should be used with the TLV5510. D External analog and digital circuitry should be physically separated and shielded as much as possible to reduce system noise. D RF breadboarding or printed-circuit-board (PCB) techniques should be used throughout the evaluation and production process. Breadboards should be copper clad for bench evaluation. D Since AGND and DGND are connected internally, the ground lead in must be kept as noise free as possible. A good method to use is twisted-pair cables for the supply lines to minimize noise pickup. An analog and digital ground plane should be used on PCB layouts when additional logic devices are used. The AGND and DGND terminals of the device should be tied to the analog ground plane. D VDDA to AGND and VDDD to DGND should be decoupled with 1-µF and 0.01-µF capacitors, respectively, placed as close as possible to the appropriate device terminals. A ceramic chip capacitor is recommended for the 0.01- µF capacitor. Care should be exercised to assure a solid noise-free ground connection for the analog and digital grounds. D VDDA, AGND, and ANALOG IN terminals should be shielded from the higher frequency terminals, CLK and D0–D7. If possible, AGND traces should be placed on both sides of the ANALOG IN traces on the PCB for shielding. D In testing or application of the device, the resistance of the driving source connected to the analog input should be 10 Ω or less within the analog frequency range of interest. |
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