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TPS54040DGQ Datasheet(PDF) 2 Page - Texas Instruments |
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TPS54040DGQ Datasheet(HTML) 2 Page - Texas Instruments |
2 / 47 page ABSOLUTE MAXIMUM RATINGS (1) TPS54040 SLVS918 – MARCH 2009................................................................................................................................................................................................... www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) TJ PACKAGE PART NUMBER(2) –40°C to 150°C 10 Pin MSOP TPS54040DGQ (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. (2) The DGQ package is also available taped and reeled. Add an R suffix to the device type (i.e., TPS54040DGQR). Over operating temperature range (unless otherwise noted). VALUE UNIT VIN –0.3 to 47 EN –0.3 to 5 BOOT 55 VSENSE –0.3 to 3 Input voltage V COMP –0.3 to 3 PWRGD –0.3 to 6 SS/TR –0.3 to 3 RT/CLK –0.3 to 3.6 BOOT-PH 8 Output voltage PH –0.6 to 47 V PH, 10-ns Transient –2 to 47 Voltage Difference PAD to GND ±200 mV EN 100 µA BOOT 100 mA Source current VSENSE 10 µA PH Current Limit A RT/CLK 100 µA VIN Current Limit A COMP 100 µA Sink current PWRGD 10 mA SS/TR 200 µA Electrostatic Discharge (HBM) QSS 009-105 (JESD22-A114A) 1 kV Electrostatic Discharge (CDM) QSS 009-147 (JESD22-C101B.01) 500 V Operating junction temperature –40 to 150 °C Storage temperature –65 to 150 °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TPS54040 |
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