STM32F101X4 datasheet(62/73 Pages) STMICROELECTRONICS | Low-density access line, ARM-based 32-bit MCU with 16 or 32 KB Flash, 5 timers, ADC and 4 communication interfaces

Part #	STM32F101X4

Description	Low-density access line, ARM-based 32-bit MCU with 16 or 32 KB Flash, 5 timers, ADC and 4 communication interfaces

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Electrical characteristics

STM32F101x4, STM32F101x6

62/74

Doc ID 15058 Rev 3

Figure 27.

ADC accuracy characteristics

Table 44.

ADC accuracy(1) (2) (3)

1.

ADC DC accuracy values are measured after internal calibration.

2.

Better performance could be achieved in restricted VDD, frequency and temperature ranges.

3.

ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-

robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion

being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to

standard analog pins which may potentially inject negative current.

Any positive injection current within the limits specified for IINJ(PIN) and IINJ(PIN) in Section 5.3.12 does not

affect the ADC accuracy.

Symbol

Parameter

Test conditions

Typ

Max(4)

4.

Based on characterization, not tested in production.

Unit

ET

Total unadjusted error

fPCLK2 = 28 MHz,

fADC = 14 MHz, RAIN < 10 k,

VDDA = 2.4 V to 3.6 V

Measurements made after

ADC calibration

±2

±5

LSB

EO

Offset error

±1.5

±2.5

EG

Gain error

±1.5

±3

ED

Differential linearity error

±1

±2

EL

Integral linearity error

±1.5

±3

EO

EG

1LSBIDEAL

(1) Example of an actual transfer curve

(2) The ideal transfer curve

(3) End point correlation line

ET=Total u nadjusted er ror: maximum deviation

between the actual and the ideal transfer curves.

EO=Offset error: deviation between the first actual

transition and the first ideal one.

EG=Gain er ror: deviation between the last ideal

transition and the last actual one.

ED=Differential linearity error: maximum deviation

between actual steps and the ideal one.

EL=Integral linearity error:

maximum deviation

between any actual transition and the end point

correlation line.

4095

4094

4093

5

4

3

2

1

0

7

6

1

2

3

456

7

4093 4094 4095 4096

(1)

(2)

ET

ED

EL

(3)

VDDA

VSSA

ai15497

VDDA

4096

[1LSBIDEAL =

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STM32F101X4 Datasheet(PDF) 62 Page - STMicroelectronics

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