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STM32F101X4 Datasheet(PDF) 62 Page - STMicroelectronics

Part # STM32F101X4
Description  Low-density access line, ARM-based 32-bit MCU with 16 or 32 KB Flash, 5 timers, ADC and 4 communication interfaces
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F101X4 Datasheet(HTML) 62 Page - STMicroelectronics

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Electrical characteristics
STM32F101x4, STM32F101x6
62/74
Doc ID 15058 Rev 3
Figure 27.
ADC accuracy characteristics
Table 44.
ADC accuracy(1) (2) (3)
1.
ADC DC accuracy values are measured after internal calibration.
2.
Better performance could be achieved in restricted VDD, frequency and temperature ranges.
3.
ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-
robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to
standard analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for IINJ(PIN) and IINJ(PIN) in Section 5.3.12 does not
affect the ADC accuracy.
Symbol
Parameter
Test conditions
Typ
Max(4)
4.
Based on characterization, not tested in production.
Unit
ET
Total unadjusted error
fPCLK2 = 28 MHz,
fADC = 14 MHz, RAIN < 10 k,
VDDA = 2.4 V to 3.6 V
Measurements made after
ADC calibration
±2
±5
LSB
EO
Offset error
±1.5
±2.5
EG
Gain error
±1.5
±3
ED
Differential linearity error
±1
±2
EL
Integral linearity error
±1.5
±3
EO
EG
1LSBIDEAL
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
ET=Total u nadjusted er ror: maximum deviation
between the actual and the ideal transfer curves.
EO=Offset error: deviation between the first actual
transition and the first ideal one.
EG=Gain er ror: deviation between the last ideal
transition and the last actual one.
ED=Differential linearity error: maximum deviation
between actual steps and the ideal one.
EL=Integral linearity error:
maximum deviation
between any actual transition and the end point
correlation line.
4095
4094
4093
5
4
3
2
1
0
7
6
1
2
3
456
7
4093 4094 4095 4096
(1)
(2)
ET
ED
EL
(3)
VDDA
VSSA
ai15497
VDDA
4096
[1LSBIDEAL =


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