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CF5075A3-4 Datasheet(PDF) 11 Page - Nippon Precision Circuits Inc |
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CF5075A3-4 Datasheet(HTML) 11 Page - Nippon Precision Circuits Inc |
11 / 14 page 5075 series SEIKO NPC CORPORATION —11 Drive Level Measurement circuit Negative Resistance Measurement circuit Note. "C0" value is set, concerning the actual crystal characteristics connected between XT and XTN. The data is measured with Agilent 4396B using NPC’s original measurement jig. The values may vary with measurement jig and conditions. VDD = 2.5V, 3.3V, fOUT = 27MHz, Ta = R.T. 0 5 10 15 20 25 30 0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3 VC [V] VDD = 2.5V VDD = 3.3V DL = (IX’tal) 2 × Re DL: drive level IX’tal: current flowing to crystal (RMS value) Re: crystal effective resistance VDD VSS XT Q Crystal XTN VC 0.1 µF CLOUT = 15pF Tektronix CT-6 Current Probe IX'tal VDD = 2.5V, C0 = 2pF, Ta = R.T. Frequency [MHz] 15 20 25 30 35 40 45 VC = 1.25V VC = 2.5V VC = 0V −200 −400 −600 −800 0 VDD = 3.3V, C0 = 2pF, Ta = R.T. Frequency [MHz] 15 20 25 30 35 40 45 −200 −400 −600 −800 0 VC = 1.65V VC = 3.3V VC = 0V VDD VSS XT Q XTN VC 0.1 µF C0 = 2pF Network Analyzer (Agilent 4396B) S-Parameter Test Set (Agilent 85046A) |
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