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ULN2003A Datasheet(PDF) 2 Page - ON Semiconductor |
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ULN2003A Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 5 page ![]() ULN2003A, ULQ2003A http://onsemi.com 2 MAXIMUM RATINGS (TA = 25°C, and rating apply to any one device in the package, unless otherwise noted.) Rating Symbol Value Unit Output Voltage VO 50 V Input Voltage VI 30 V Collector Current - Continuous IC 500 mA Base Current - Continuous IB 25 mA Operating Ambient Temperature Range ULN2003A ULQ2003A TA -20 to +85 -40 to +85 °C Storage Temperature Range Tstg -55 to +150 °C Junction Temperature TJ 150 °C Thermal Resistance, Junction-to-Ambient Case 751B, D Suffix RqJA 100 °C/W Thermal Resistance, Junction-to-Case Case 751B, D Suffix RqJC 20 °C/W Electrostatic Discharge Sensitivity (ESD) Human Body Model (HBM) Machine Model (MM) Charged Device Model (CDM) ESD 2000 400 1500 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. |
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