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W2630 Datasheet(PDF) 2 Page - Agilent(Hewlett-Packard) |
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W2630 Datasheet(HTML) 2 Page - Agilent(Hewlett-Packard) |
2 / 12 page 2 Features The Agilent W2630 Series DDR2 BGA probes for logic analyzers and oscilloscopes enable viewing of data traffic on industry standard DDR2 DRAMs with the Agilent 16900 Series logic analysis system and Infiniium 80000 Series oscilloscopes. Features Benefits Connects directly to the DDR2 BGA balls Eliminates reflections from mid-bus probing methods. Also eliminates board space and trace routing required for connector probing methods. Supports: • x8 (84 ball) all signals • x16 (92 ball) all signals and x16 (84 ball) without mechanical support balls • x4 (60 ball) dual die packages with traces to CS0, CKE0, and OTD0 only • Quad die packages with W2632A and traces to CS0, CKE0 and ODT0 only Get complete signal access to the DDR2 signals critical to your debug and validation effort Buried resistors provide signal isolation and minimize capacitive loading. Probe loading: 2 pF Minimum signal amplitude: • 250 mV p-p for single-ended signals • V max – Vmin 100 mV for differential signals Acquire high-speed signals without impacting the performance of your design. The DDR2 BGA probe provides a non-intrusive electrical and mechanical connection between the memory device and an Agilent 16900 Series logic analyzer. • Operating transfer rate of 800 Mb/s • 2 GHz bandwidth Operate at full speed whether you’re making measurements with a logic analyzer or oscilloscope. Works with existing designs Eliminates need for re-design or up front planning. Supports either leaded or lead-free solder Easily works with all solder finishes. Designed to tolerate lead-free soldering temperature profiles. Contract manufactures available for those without the in-house expertise or facilities for soldering BGAs Eliminates the need to develop BGA soldering expertise. Flexible “wings” with ZIF connectors Ensures reliable connection to the ZIF probes. Enables placement of the probe cables around adjacent components. Minimizes the torque to the balls of the BGA. Attach to E5384A, E5826A, or E5827A single-ended ZIF probes for connection to the logic analyzer Optimizes the use of logic analyzer channels by allowing assignment of channels to 8 or 16 bits on each DRAM. Probe points available for soldering ZIF tip accessories to the scope probe adapter board that connects to the BGA probe Enables oscilloscope probing of the DRAM signals with an Agilent Infiniium 80000 Series oscilloscope, giving you a DDR2 test solution covering the clock characterization, electrical and timing parameters of the JEDEC specification. |
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