2

Features

The Agilent W2630 Series DDR2

BGA probes for logic analyzers and

oscilloscopes enable viewing of data

traffic on industry standard DDR2

DRAMs with the Agilent 16900 Series

logic analysis system and Infiniium

80000 Series oscilloscopes.

Features

Benefits

Connects directly to the DDR2 BGA

balls

Eliminates reflections from mid-bus probing

methods. Also eliminates board space and trace

routing required for connector probing methods.

Supports:

• x8 (84 ball) all signals

• x16 (92 ball) all signals and

x16 (84 ball) without mechanical

support balls

• x4 (60 ball) dual die packages

with traces to CS0, CKE0, and

OTD0 only

• Quad die packages with W2632A

and traces to CS0, CKE0 and

ODT0 only

Get complete signal access to the DDR2 signals

critical to your debug and validation effort

Buried resistors provide signal

isolation and minimize capacitive

loading.

Probe loading: 2 pF

Minimum signal amplitude:

• 250 mV p-p for single-ended

signals

• V

signals

Acquire high-speed signals without impacting

the performance of your design. The DDR2 BGA

probe provides a non-intrusive electrical and

mechanical connection between the memory

device and an Agilent 16900 Series logic

analyzer.

• Operating transfer rate of

800 Mb/s

• 2 GHz bandwidth

Operate at full speed whether you’re making

measurements with a logic analyzer or

oscilloscope.

Works with existing designs

Eliminates need for re-design or up front

planning.

Supports either leaded or lead-free

solder

Easily works with all solder finishes. Designed

to tolerate lead-free soldering temperature

profiles.

Contract manufactures available for

those without the in-house expertise

or facilities for soldering BGAs

Eliminates the need to develop BGA soldering

expertise.

Flexible “wings” with ZIF connectors Ensures reliable connection to the ZIF probes.

Enables placement of the probe cables around

adjacent components. Minimizes the torque to

the balls of the BGA.

Attach to E5384A, E5826A, or

E5827A single-ended ZIF probes for

connection to the logic analyzer

Optimizes the use of logic analyzer channels by

allowing assignment of channels to 8 or 16 bits

on each DRAM.

Probe points available for soldering

ZIF tip accessories to the scope

probe adapter board that connects

to the BGA probe

Enables oscilloscope probing of the DRAM

signals with an Agilent Infiniium 80000

Series oscilloscope, giving you a DDR2 test

solution covering the clock characterization,

electrical and timing parameters of the JEDEC

specification.