74ABT821PW datasheet(9/16 Pages) NXP

Part #	74ABT821PW

Description	10-bit D-type flip-flop; positive-edge trigger; 3-state

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Manufacturer	NXP [NXP Semiconductors]

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74ABT821_3

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Product data sheet

Rev. 03 — 25 February 2010

9 of 16

NXP Semiconductors

74ABT821

10-bit D-type ﬂip-ﬂop; positive-edge trigger; 3-state

a. Input pulse deﬁnition

b. Test circuit

Test data and VEXT levels are given in Table 8.

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

VEXT = Test voltage for switching times.

Fig 8.

Test circuit for measuring switching times

001aai298

VM

tW

10 %

90 %

0 V

VI

negative

pulse

positive

pulse

0 V

VM

90 %

10 %

90 %

10 %

tf

tr

tf

VEXT

VCC

VI

VO

mna616

DUT

CL

RT

RL

G

Table 8.

Test data

Input

Load

VEXT

VI

fI

tW

tr, tf

CL

RL

tPHL, tPLH

tPZH, tPHZ

tPZL, tPLZ

3.0 V

1 MHz

500 ns

≤ 2.5 ns

50 pF

500

Ω

open

7.0 V

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