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A5303 Datasheet(PDF) 4 Page - Allegro MicroSystems |
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A5303 Datasheet(HTML) 4 Page - Allegro MicroSystems |
4 / 14 page Photoelectric Smoke Detector with Interconnect, Timer, and Latching Alarm Indicator A5303 4 Allegro MicroSystems, Inc. 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com Continued on the next page… AC ELECTRICAL CHARACTERISTICS1 Valid at TA = 25°C, VDD = 2.3 to 5.5 V, configured as in Typical Application Diagram (unless otherwise noted) Characteristics Symbol Test Conditions OSC Count Min. Typ.2 Max. Unit Oscillator Period tosc 1 9.4 10.5 11.5 ms Smoke Check tsmoke 210 9.6 10.75 11.9 s Low Battery Test tbattery No low-battery detected 218 41.3 45.9 50.5 min tbattery2 Low-battery detected 212 39 43 48 s Degraded Chamber Test tchamber No degraded chamber detected 218 41.3 45.9 50.5 min tchamber2 Degraded chamber detected 212 39 43 48 s LED Pulse Period tled0 No local or remote smoke, BLINK = VSS – – No LED Pulses –– tled1 No local or remote smoke, BLINK = VDD 212 39 43 48 s tled3 Local smoke 48 0.45 0.50 0.55 s tled4 Remote smoke only – – No LED Pulses –– tled6 Pushbutton test, induced alarm 48 0.45 0.50 0.55 s tled7 Timer mode, no alarm 210 9.67 10.75 11.83 s LED Pulse Width tw(led) 1 9.5 10.5 11.5 ms LED Pulse Spacing tsp(led) 3 pulses, degraded chamber 26 0.60 0.67 0.74 s STROBE Pulse Period tst1 No local or remote smoke 210 9.6 10.75 11.9 s tst2 After 1 of 3 valid samples 192 1.8 2.0 2.2 s tst3 After 2 of 3 valid samples and during local alarm 96 0.8 1.0 1.1 s tst4 Remote smoke only 768 7.2 8.0 8.9 s tst5 Chamber test, no local alarm 218 41.3 45.9 50.5 min tst6 Pushbutton test, induced alarm 24 225 252 278 ms STROBE Pulse Width tw(st) 1 9.5 10.5 11.5 ms IRED Pulse Period tired1 No local or remote smoke 210 9.6 10.75 11.9 s tired2 After 1 of 3 valid samples 192 1.8 2.0 2.2 s tired3 After 2 of 3 valid samples and during local alarm 96 0.8 1.0 1.1 s tired4 Remote smoke only 768 7.2 8.0 8.9 s tired5 Chamber test, no local alarm 218 41.3 45.9 50.5 min tired6 Pushbutton test, induced alarm 24 225 252 278 ms IRED Pulse Width tw(ired) 0.01 94 105 116 μs I/O to Active Delay td(io) Local alarm – – 0 – s I/O Charge Dump Duration tdump End of local alarm or test 96 0.9 1.0 1.1 s Rising Edge on I/O to Alarm tr(io) No local alarm 9 to 13 9 × tosc 94.5 – 137 13 × tosc ms |
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