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74LVC1G53DC Datasheet(PDF) 7 Page - NXP Semiconductors |
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74LVC1G53DC Datasheet(HTML) 7 Page - NXP Semiconductors |
7 / 23 page 74LVC1G53_5 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 05 — 11 June 2008 7 of 23 NXP Semiconductors 74LVC1G53 2-channel analog multiplexer/demultiplexer 10.1 Test circuits 10.2 ON resistance VI =VCC or GND; VO = GND or VCC. Fig 7. Test circuit for measuring OFF-state leakage current VO IS 001aad390 S Z E Y0 Y1 VCC GND switch switch 1 1 2 2 VIH VIL S VIH VIH E VI VIL or VIH VIH VI =VCC or GND and VO = open circuit. Fig 8. Test circuit for measuring ON-state leakage current IS 001aad391 S Z E Y0 Y1 VCC GND VI VIL or VIH VIL switch 1 2VIH VIL S VIL VIL E VO switch 1 2 Table 8. ON resistance At recommended operating conditions; voltages are referenced to GND (ground 0 V); for graphs see Figure 10 to Figure 15. Symbol Parameter Conditions −40 °C to +85 °C −40 °C to +125 °C Unit Min Typ[1] Max Min Max RON(peak) ON resistance (peak) VI = GND to VCC; see Figure 9 ISW = 4 mA; VCC = 1.65 V to 1.95 V - 34.0 130 - 195 Ω ISW = 8 mA; VCC = 2.3 V to 2.7 V - 12.0 30 - 45 Ω ISW = 12 mA; VCC = 2.7 V - 10.4 25 - 38 Ω ISW = 24 mA; VCC = 3 V to 3.6 V - 7.8 20 - 30 Ω ISW = 32 mA; VCC = 4.5 V to 5.5 V - 6.2 15 - 23 Ω |
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