ADS1113

ADS1114

ADS1115

SBAS444B – MAY 2009 – REVISED OCTOBER 2009

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERING INFORMATION

For the most current package and ordering information, see the Package Option Addendum at the end of this

document, or see the TI web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

ADS1113, ADS1114, ADS1115

UNIT

VDD to GND

–0.3 to +5.5

V

Analog input current

100, momentary

mA

Analog input current

10, continuous

mA

Analog input voltage to GND

–0.3 to VDD + 0.3

V

SDA, SCL, ADDR, ALERT/RDY voltage to GND

–0.5 to +5.5

V

Maximum junction temperature

+150

°C

Storage temperature range

–60 to +150

°C

(1)

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

PRODUCT FAMILY

PACKAGE

INPUT CHANNELS

DESIGNATOR

RESOLUTION

MAXIMUM SAMPLE

(Differential/

DEVICE

MSOP/QFN

(Bits)

RATE (SPS)

COMPARATOR

PGA

Single-Ended)

ADS1113

BROI/N6J

16

860

No

No

1/1

ADS1114

BRNI/N5J

16

860

Yes

Yes

1/1

ADS1115

BOGI/N4J

16

860

Yes

Yes

2/4

ADS1013

BRMI/N9J

12

3300

No

No

1/1

ADS1014

BRQI/N8J

12

3300

Yes

Yes

1/1

ADS1015

BRPI/N7J

12

3300

Yes

Yes

2/4

2

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