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ADS6423IRGCT Datasheet(PDF) 3 Page - Texas Instruments |
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ADS6423IRGCT Datasheet(HTML) 3 Page - Texas Instruments |
3 / 71 page www.ti.com ABSOLUTE MAXIMUM RATINGS (1) ADS6424 ADS6423 ADS6422 SLAS532A – MAY 2007 – REVISED JUNE 2007 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. PACKAGE/ORDERING INFORMATION(1) SPECIFIED TRANSPORT PACKAGE PACKAGE PRODUCT PACKAGE-LEAD TEMPERATURE ORDERING NUMBER MEDIA, DESIGNATOR MARKING RANGE QUANTITY ADS6424IRGCT 250, Tape/reel ADS6424 QFN-64(2) RGC –40 °C to 85°C AZ6424 ADS6424IRGCR 2000, Tape/reel ADS6423IRGCT 250, Tape/reel ADS6423 QFN-64(2) RGC –40 °C to 85°C AZ6423 ADS6423IRGCR 2000, Tape/reel ADS6422IRGCT 250, Tape/reel ADS6422 QFN-64(2) RGC –40 °C to 85°C AZ6422 ADS6422IRGCR 2000, Tape/reel (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) For thermal pad size on the package, see the mechanical drawings at the end of this data sheet. θJA = 23.17 °C/W (0 LFM air flow), θJC = 22.1 °C/W when used with 2 oz. copper trace and pad soldered directly to a JEDEC standard four layer 3 in. x 3 in. PCB. VALUE UNIT AVDD Supply voltage range –0.3 to 3.9 V LVDD Supply voltage range –0.3 to 3.9 V Voltage between AGND and DGND –0.3 to 0.3 V Voltage between AVDD to LVDD –0.3 to 3.3 V Voltage applied to external pin, VCM –0.3 to 2.0 V Voltage applied to analog input pins –0.3V to minimum ( 3.6, AVDD + 0.3V) V TA Operating free-air temperature range –40 to 85 °C TJ Operating junction temperature range 125 °C Tstg Storage temperature range –65 to 150 °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Copyright © 2007, Texas Instruments Incorporated 3 Submit Documentation Feedback |
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