SN65EPT21

SLLS970 – NOVEMBER 2009

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

(1)

PARAMETER

CONDITIONS

VALUE

UNIT

Absolute PECL mode supply voltage

3.8

V

±0.5

mA

PECL input voltage

0 to 3.8

V

Operating temperature range

–40 to 85

°C

Storage temperature range

–65 to 150

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only and functional operation of the device at these or any conditions beyond those indicated under recommended operating conditions

is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

DISSIPATION RATINGS

POWER RATING

THERMAL RESISTANCE,

DERATING FACTOR

POWER RATING

CIRCUIT BOARD

JUNCTION-TO-AMBIENT

PACKAGE

MODEL

NO AIRFLOW

(mW)

(mW/°C)

(mW)

SOIC

Low-K

719

139

7

288

High-K

840

119

8

336

MSOP

Low-K

469

213

5

188

High-K

527

189

5

211

THERMAL CHARACTERISTICS

over operating free-air temperature range (unless otherwise noted)

PARAMETER

MIN

TYP

MAX

UNIT

Junction-to-board thermal resistance

SOIC

79

°C/W

MSOP

120

Junction-to-case thermal resistance

SOIC

98

°C/W

MSOP

74

KEY ATTRIBUTES

CHARACTERISTICS

VALUE

Internal input pull-down resistor

50 k

Ω

Internal input pull-up resistor

50 k

Ω

Moisture sensitivity level

Level 1

Flammability rating (oxygen index: 28 to 34)

UL 94 V-0 at 0.125 in

Electrostatic discharge

Human body model

2 kV

Charged-device model

2 kV

Machine mode

200 V

Meets or exceeds JEDEC Spec EIA/JESD78 latchup test

2

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