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CAT28C16AL-12T Datasheet(PDF) 4 Page - ON Semiconductor |
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CAT28C16AL-12T Datasheet(HTML) 4 Page - ON Semiconductor |
4 / 10 page CAT28C16A http://onsemi.com 4 Figure 2. A.C. Testing Input/Output Waveform (Note 11) INPUT PULSE LEVELS REFERENCE POINTS 2.0 V 0.8 V 2.4 V 0.45 V 11. Input rise and fall times (10% and 90%) < 10 ns. Figure 3. A.C. Testing Load Circuit (example) 1.3V DEVICE UNDER TEST 1N914 3.3K OUT CL = 100 pF CL INCLUDES JIG CAPACITANCE Table 7. A.C. CHARACTERISTICS, WRITE CYCLE (VCC = 5 V ±10%, unless otherwise specified.) Symbol Parameter 28C16A−90 28C16A−12 28C16A−20 Units Min Max Min Max Min Max tWC Write Cycle Time 5 5 10 ms tAS Address Setup Time 0 0 10 ns tAH Address Hold Time 100 100 100 ns tCS CE Setup Time 0 0 0 ns tCH CE Hold Time 0 0 0 ns tCW (Note 12) CE Pulse Time 110 110 150 ns tOES OE Setup Time 0 0 15 ns tOEH OE Hold Time 0 0 15 ns tWP (Note 12) WE Pulse Width 110 110 150 ns tDS Data Setup Time 60 60 50 ns tDH Data Hold Time 0 0 10 ns tDL Data Latch Time 5 10 5 10 50 ns tINIT (Note 13) Write Inhibit Period After Power−up 0.05 100 0.05 100 5 20 ms 12.A write pulse of less than 20 ns duration will not initiate a write cycle. 13.This parameter is tested initially and after a design or process change that affects the parameter. |
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