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CAT5251YI-00-T2 Datasheet(PDF) 6 Page - ON Semiconductor |
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CAT5251YI-00-T2 Datasheet(HTML) 6 Page - ON Semiconductor |
6 / 15 page CAT5251 Doc. No. MD-2017 Rev. H 6 © 2009 SCILLC. All rights reserved. Characteristics subject to change without notice WRITE CYCLE LIMITS Over recommended operating conditions unless otherwise stated. Symbol Parameter Min Typ Max Units tWR Write Cycle Time 5 ms RELIABILITY CHARACTERISTICS Over recommended operating conditions unless otherwise stated. Symbol Parameter Reference Test Method Min Typ Max Units NEND (1) Endurance MIL-STD-883, Test Method 1033 1,000,000 Cycles/Byte TDR (1) Data Retention MIL-STD-883, Test Method 1008 100 Years VZAP (1) ESD Susceptibility MIL-STD-883, Test Method 3015 2000 V ILTH (1) Latch-Up JEDEC Standard 17 100 mA Figure 1. Sychronous Data Timing Note: Dashed Line = mode (1, 1) Figure 2. HOLD ¯¯¯¯¯ Timing Notes: (1) This parameter is tested initially and after a design or process change that affects the parameter. VALID IN VIH VIL IL VIH VIL VIH V VOH VOL HI-Z tSU tH tWH tWL tV tCS tCSH tHO tDIS HI-Z SCK SI SO tRI tFI tCSS CS CS SCK HOLD SO tCD tHD tHD tCD tLZ tHZ HIGH IMPEDANCE |
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