Unless otherwise specified, all limits guaranteed for at T

= 10 M

Ω. Boldface limits apply at the temperature extremes.

Symbol

Parameter

Condition

Min

(Note 6)

Typ

(Note 5)

Max

(Note 6)

Units

V

OS

Input Offset Voltage

V

-1

-1.7

1

1.7

mV

TCV

OS

Input Offset Voltage Drift(Note 7,

Note 9)

V

7

μV/°C

I

B

Input Bias Current(Note 10)

V

13

23

μA

e

ni

Input Voltage Noise (Note 9)

f > 10 kHz, R

120

nV/

V

SENSE(MAX)

Max Input Sense Voltage(Note 9) V

600

mV

Gain A

V

Adjustable Gain Setting (Note 9)

V

1

100

V/V

Gm

Transconductance

V

200

µA/V

Accuracy

V

-2

-3.4

2

3.4

%

Gm drift (Note 9)

−40°C to 125°C, V

140

ppm /°C

PSRR

Power Supply Rejection Ratio

V

90

dB

CMRR

Common Mode Rejection Ratio

LMP8645HV 2.1V <V

LMP8645 2.1V <V

95

dB

–2V <V

60

BW

−3 dB Bandwidth (Note 9)

R

C

860

kHz

R

C

260

R

C

140

SR

Slew Rate(Note 8, Note 9)

V

to 500 mV, C

0.6

V/µs

I

S

Supply Current

V

555

765

920

uA

V

2200

2900

3110

V

OUT

Maximum Output Voltage

V

10.2

V

Minimum Output Voltage

V

24

mV

I

OUT

Output current (Note 9)

Sourcing, V

5

mA

Sinking, V

5

C

LOAD

Max Output Capacitance Load

(Note 9)

30

pF

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device

is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics

Tables.

Note 2: Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of JEDEC) Field-

Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

Note 3: The maximum power dissipation must be derated at elevated temperatures and is dictated by T

allowable power dissipation P

Note 4: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating

of the device such that T

T

Note 5: Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and will also depend

on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material.

Note 6: All limits are guaranteed by testing, design, or statistical analysis.

Note 7: Offset voltage temperature drift is determined by dividing the change in V

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