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KM48V2100B Datasheet(PDF) 8 Page - Samsung semiconductor

Part # KM48V2100B
Description  2M x 8Bit CMOS Dynamic RAM with Fast Page Mode
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Manufacturer  SAMSUNG [Samsung semiconductor]
Direct Link  http://www.samsung.com/Products/Semiconductor
Logo SAMSUNG - Samsung semiconductor

KM48V2100B Datasheet(HTML) 8 Page - Samsung semiconductor

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KM48C2000B, KM48C2100B
CMOS DRAM
KM48V2000B, KM48V2100B
NOTES
An initial pause of 200us is required after power-up followed by any 8 ROR or CBR cycles before proper device operation is
achieved.
VIH(min) and VIL(max) are reference levels for measuring timing of input signals.
Transition times are measured between VIH(min) and VIL(max) and are assumed to be 5ns for all inputs.
Measured with a load equivalent to 2 TTL(5V)/1TTL(3.3V) loads and 100pF.
Operation within the
tRCD(max) limit insures that tRAC(max) can be met. tRCD(max) is specified as a reference point only.
If
tRCD is greater than the specified tRCD(max) limit, then access time is controlled exclusively by tCAC.
This parameter defines the time at which the output achieves the open circuit condition and is not referenced to Voh or Vol.
tWCS, tRWD, tCWD, tAWD and tCPWD are non restrictive operating parameters. They are included in the data sheet as electrical
characteristics only. If
tWCS¡ÃtWCS(min), the cycles is an early write cycle and the data output will remain high impedance for
the duration of the cycle. If
tCWD¡ÃtCWD(min), tRWD¡ÃtRWD(min), tAWD¡ÃtAWD(min) and tCPWD¡ÃtCPWD(min), then the cycle is a
read-modify-write cycle and the data output will contain the data read from the selected address. If neither of the above condi-
tions is satisfied, the condition of the data out is indeterminate.
Either
tRCH or tRRH must be satisfied for a read cycle.
These parameters are referenced to the CAS falling edge in ealy write cycles and to the W falling edge in OE controlled write
cycle and read-modify-write cycles.
Operation within the
tRAD(max) limit insures that tRAC(max) can be met. tRAD(max) is specified as a reference point only.
If
tRAD is greater than the specified tRAD(max) limit, then access time is controlled by tAA.
These specifications are applied in the test mode.
In test mode read cycle, the values of
tRAC, tAA and tCAC are delayed by 2ns to 5ns for the specified values. These parame-
ters should be specified in test mode cycles by adding 5ns to the specified value in this data sheet.
For all of the refresh modes except for distributed CAS -before- RAS refresh, 4096(4K Ref.)/2048(2K Ref.) cycles of burst
refresh must be executed within 16ms before and after self-refresh in order to meet refresh specification.
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