60

1%

W ±

V

OD

0Vor3V

_

+

–20V<V(test)<25V

DE

V

CC

A

B

D

375

1%

W ±

375

1%

W ±

S0301-01

V

OC

27

1%

W ±

27

1%

W ±

Input

A

B

V

A

V

B

V

OC(PP)

V

OC

C =50pF

L

±20%

D

A

B

DE

V

CC

C IncludesFixtureand

L

InstrumentationCapacitance

S0302-01

SN65HVD1785, SN65HVD1786

SN65HVD1787, SN65HVD1791

SN65HVD1792, SN65HVD1793

SLLS872H – JANUARY 2008 – REVISED FEBRUARY 2010

www.ti.com

THERMAL INFORMATION

PARAMETER

TEST CONDITIONS

VALUE

UNIT

JEDEC high-K model

138

SOIC-8

JEDEC low-K model

242

JEDEC high-K model

59

DIP-8

°C/W

JEDEC low-K model

128

JEDEC high-K model

95

SOIC-14

JEDEC low-K model

168

SOIC-8

62

DIP-8

39

°C/W

SOIC-14

40

SOIC-8

61

DIP-8

61

°C/W

SOIC-14

44

85, 91

290

85, 91

86

320

Power dissipation

mW

87

85, 91

400

86

87

Thermal-shutdown junction temperature

170

°C

(1)

Driver and receiver enabled, 50% duty cycle square-wave signal at signaling rate: HVD1785, 1791 at 115 kbps, HVD1786 at 1 Mbps,

HVD1787 at 10 Mbps)

PARAMETER MEASUREMENT INFORMATION

Input generator rate is 100 kbps, 50% duty cycle, rise and fall times less than 6 nsec, output impedance 50

Ω.

Figure 1. Measurement of Driver Differential Output Voltage With Common-Mode Load

Figure 2. Measurement of Driver Differential and Common-Mode Output With RS-485 Load

6

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Product Folder Link(s): SN65HVD1785, SN65HVD1786 SN65HVD1787, SN65HVD1791 SN65HVD1792, SN65HVD1793