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ISL6615CRZ Datasheet(PDF) 9 Page - Intersil Corporation |
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ISL6615CRZ Datasheet(HTML) 9 Page - Intersil Corporation |
9 / 11 page 9 FN6481.0 April 24, 2008 • Shorten all gate drive loops (UGATE-PHASE and LGATE-GND) and route them closely spaced. • Minimize the inductance of the PHASE node. Ideally, the source of the upper and the drain of the lower MOSFET should be as close as thermally allowable. • Minimize the current loop of the output and input power trains. Short the source connection of the lower MOSFET to ground as close to the transistor pin as feasible. Input capacitors (especially ceramic decoupling) should be placed as close to the drain of upper and source of lower MOSFETs as possible. • Avoid routing relatively high impedance nodes (such as PWM and ENABLE lines) close to high dV/dt UGATE and PHASE nodes. In addition, for heat spreading, place copper underneath the IC whether it has an exposed pad or not. The copper area can be extended beyond the bottom area of the IC and/or connected to buried power ground plane(s) with thermal vias. This combination of vias for vertical heat escape, extended copper plane, and buried planes for heat spreading allows the IC to achieve its full thermal potential. Upper MOSFET Self Turn-On Effects at Start-up Should the driver have insufficient bias voltage applied, its outputs are floating. If the input bus is energized at a high dV/dt rate while the driver outputs are floating, due to the self-coupling via the internal CGD of the MOSFET, the UGATE could momentarily rise up to a level greater than the threshold voltage of the MOSFET. This could potentially turn on the upper switch and result in damaging inrush energy. Therefore, if such a situation (when input bus powered up before the bias of the controller and driver is ready) could conceivably be encountered, it is a common practice to place a resistor (RUGPH) across the gate and source of the upper MOSFET to suppress the Miller coupling effect. The value of the resistor depends mainly on the input voltage’s rate of rise, the CGD/CGS ratio, as well as the gate-source threshold of the upper MOSFET. A higher dV/dt, a lower CDS/CGS ratio, and a lower gate-source threshold upper FET will require a smaller resistor to diminish the effect of the internal capacitive coupling. For most applications, the integrated 20k Ω typically sufficient, not affecting normal performance and efficiency. The coupling effect can be roughly estimated with the formulas in Equation 5, which assume a fixed linear input ramp and neglect the clamping effect of the body diode of the upper drive and the bootstrap capacitor. Other parasitic components such as lead inductances and PCB capacitances are also not taken into account. These equations are provided for guidance purpose only. Therefore, the actual coupling effect should be examined using a very high impedance (10M Ω or greater) probe to ensure a safe design margin. V GS_MILLER dV dt ------- RC rss 1e V – DS dV dt ------- RC ⋅ iss ⋅ ---------------------------------- – ⎝⎠ ⎜⎟ ⎜⎟ ⎜⎟ ⎜⎟ ⎛⎞ ⋅⋅ = RR UGPH R GI + = C rss C GD = C iss C GD C GS + = (EQ. 5) FIGURE 5. GATE-TO-SOURCE RESISTOR TO REDUCE UPPER MOSFET MILLER COUPLING VIN QUPPER D S G RGI BOOT DU CDS CGS CGD DL PHASE PVCC CBOOT UGATE ISL6615 |
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