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TPS65835 Datasheet(PDF) 10 Page - Texas Instruments

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Part # TPS65835
Description  Advanced PMU With Integrated MSP430 For Active Shutter 3D Glasses
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

TPS65835 Datasheet(HTML) 10 Page - Texas Instruments

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TPS65835
SLVSAF6
– JUNE 2011
www.ti.com
Table 1-1. Pin Descriptions (continued)
PIN NAME
I/O
PIN NO.
DESCRIPTION
P1.5/
General-purpose digital I/O pin
TA0.0/
Timer0_A, compare: Out0 output
UCB0CLK/
USCI_B0 clock input/output
UCA0STE/
I/O
39
USCI_A0 slave transmit enable
A5/
ADC10 analog input A5
CA5/
Comparator_A+, CA5 input
TMS
JTAG test mode select, input terminal for device programming and test
P1.6/
General-purpose digital I/O pin
TA0.1/
Timer0_A, compare: Out1 output
A6/
ADC10 analog input A6
CA6/
I/O
13
Comparator_A+, CA6 input
UCB0SOMI/
USCI_B0 slave out/master in SPI mode
UCB0SCL/
USCI_B0 SCL I2C clock in I2C mode
TDI/TCLK
JTAG test data input or test clock input during programming and test
P1.7/
General-purpose digital I/O pin
A7/
ADC10 analog input A7
CA7/
Comparator_A+, CA7 input
CAOUT/
I/O
16
Comparator_A+, output
UCB0SIMO/
USCI_B0 slave in/master out in SPI mode
UCB0SDA/
USCI_B0 SDA I2C data in I2C mode
TDO/TDI
JTAG test data output terminal or test data input during programming and test(2)
P2.1/
General-purpose digital I/O pin
I/O
1
TA1.1
Timer1_A, capture: CCI1A input, compare: Out1 output
P2.2/
General-purpose digital I/O pin
I/O
2
TA1.1
Timer1_A, capture: CCI1B input, compare: Out1 output
P2.6/
General-purpose digital I/O pin
XIN/
I/O
24
XIN, Input terminal of crystal oscillator
TA0.1
TA0.1, Timer0_A, compare: Out1 output
P2.7/
General-purpose digital I/O pin
I/O
21
XOUT
Output terminal of crystal oscillator(3))
P3.3/
General-purpose digital I/O pin
I/O
3
TA1.2
Timer1_A, compare: Out2 output
P3.5/
General-purpose digital I/O pin
I/O
9
TA0.1
Timer0_A, compare: Out0 output
nRST/
Reset
NMI/
I/O
17
Nonmaskable interrupt input
SBWTDIO
Spy-Bi-Wire test data input/output during programming and test
TEST/
Selects test mode for JTAG pins on Port 1. The device protection fuse is connected to TEST.
I
20
SBWTCK
Spy-Bi-Wire test clock input during programming and test
DVSS
-
25
MSP430 Ground reference(4)
MISC. AND PACKAGE
There is an internal electrical connection between the exposed thermal pad and the AGND ground
pin of the device. The thermal pad must be connected to the same potential as the AGND pin on
Thermal PAD
-
41
the printed circuit board. Do not use the thermal pad as the primary ground input for the device.
AGND pin must be connected to ground at all times.
All N/C pins are not connected internally (package to die). They should be connected to the main
N/C
-
10, 40
system ground.
(2)
TDO or TDI is selected via JTAG instruction.
(3)
If P2.7 is used as an input, excess current will flow until P2SEL.7 is cleared. This is due to the oscillator output driver connection to this
pad after reset.
(4)
MSP430 ground and grounds for PMIC (Power Management Core) are connected internally.
Table 1-2. Pin Absolute Maximum Ratings
PIN
VALUE / UNIT
Input voltage range on all pins (except for VIN, BST_OUT, BST_SW, BST_FB, VLDO, LCLP, LCLN, LCRP,
-0.3 V to 7.0 V
LCRN, AGND, DGND, PGNDBST, and MSP430 Core pins) with respect to AGND
VIN with respect to AGND
-0.3 V to 28.0 V
BST_OUT, BST_SW with respect to PGNDBST
-0.3 V to 18.0 V
BST_FB with respect to PGNDBST, VLDO with respect to DGND
-0.3 V to 3.6 V
MSP430 Core Pins
-0.3 V to 4.1 V
10
INTRODUCTION
Copyright
© 2011, Texas Instruments Incorporated
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